Axel Nackaerts

Person

Haasrode, BE

People

Patents Grantslast 30 patents

Information Patent Grant
Device for electromagnetic structural characterization
- Patent number 11,293,963
- Issue date Apr 5, 2022
- NXP B.V.
- Anthony Kerselaers
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Segmented platform for items
- Patent number 10,747,851
- Issue date Aug 18, 2020
- NXP B.V.
- Axel Nackaerts
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Liquid exposure sensing device and controller
- Patent number 10,712,303
- Issue date Jul 14, 2020
- NXP B.V.
- Axel Nackaerts
- G01 - MEASURING TESTING
Information Patent Grant
Wireless device
- Patent number 10,498,397
- Issue date Dec 3, 2019
- NXP B.V.
- Axel Nackaerts
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Buffer device, an electronic system, and a method for operating a b...
- Patent number 10,417,147
- Issue date Sep 17, 2019
- NXP B.V.
- Axel Nackaerts
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuit with a pressure sensor
- Patent number 10,060,817
- Issue date Aug 28, 2018
- ams International AG
- Axel Nackaerts
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Substance detection device
- Patent number 9,739,774
- Issue date Aug 22, 2017
- NXP B.V.
- Axel Nackaerts
- G01 - MEASURING TESTING
Information Patent Grant
Analyte detection methods and devices
- Patent number 9,606,115
- Issue date Mar 28, 2017
- NXP B.V.
- Viet Hoang Nguyen
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing an integrated circuit comprising a pressure...
- Patent number 9,481,570
- Issue date Nov 1, 2016
- ams International AG
- Axel Nackaerts
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Integrated circuit with pressure sensor having a pair of electrodes
- Patent number 9,269,832
- Issue date Feb 23, 2016
- ams International AG
- Axel Nackaerts
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Lighting system
- Patent number 9,210,761
- Issue date Dec 8, 2015
- NXP, B.V.
- Axel Nackaerts
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Integrated circuit with ion sensitive sensor and manufacturing method
- Patent number 9,099,486
- Issue date Aug 4, 2015
- NXP, B.V.
- Matthias Merz
- G01 - MEASURING TESTING
Information Patent Grant
Sensor
- Patent number 8,957,687
- Issue date Feb 17, 2015
- NXP, B.V.
- Axel Nackaerts
- G01 - MEASURING TESTING
Information Patent Grant
Sensor and measurement method
- Patent number 8,872,520
- Issue date Oct 28, 2014
- NXP, B.V.
- Axel Nackaerts
- G01 - MEASURING TESTING
Information Patent Grant
Capacitive sensor, integrated circuit, electronic device and method
- Patent number 8,779,781
- Issue date Jul 15, 2014
- NXP, B.V.
- Viet Hoang Nguyen
- G01 - MEASURING TESTING
Information Patent Grant
Optimization
- Patent number 8,136,078
- Issue date Mar 13, 2012
- IMEC
- Axel Nackaerts
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for high topography patterning
- Patent number 8,021,989
- Issue date Sep 20, 2011
- IMEC
- Staf Verhaegen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device for measuring an overlay error, method for mea...
- Patent number 7,786,477
- Issue date Aug 31, 2010
- ASML Netherlands B.V.
- Mircea Dusa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for making quantum dots
- Patent number 7,737,008
- Issue date Jun 15, 2010
- IMEC
- Rita Rooyackers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device for measuring an overlay error, method for mea...
- Patent number 7,704,850
- Issue date Apr 27, 2010
- ASML Netherlands B.V.
- Mircea Dusa
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
LIQUID EXPOSURE SENSING DEVICE AND CONTROLLER
- Publication number 20200049650
- Publication date Feb 13, 2020
- NXP B.V.
- Axel Nackaerts
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR ELECTROMAGNETIC STRUCTURAL CHARACTERIZATION
- Publication number 20190162766
- Publication date May 30, 2019
- NXP B.V.
- Anthony Kerselaers
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SEGMENTED PLATFORM FOR ITEMS
- Publication number 20180357388
- Publication date Dec 13, 2018
- NXP B.V.
- Axel Nackaerts
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
BUFFER DEVICE, AN ELECTRONIC SYSTEM, AND A METHOD FOR OPERATING A B...
- Publication number 20180046590
- Publication date Feb 15, 2018
- NXP B.V.
- Axel Nackaerts
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SUBSTANCE DETECTION DEVICE
- Publication number 20170067891
- Publication date Mar 9, 2017
- NXP B.V.
- Axel Nackaerts
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT WITH A PRESSURE SENSOR
- Publication number 20160377497
- Publication date Dec 29, 2016
- ams International AG
- Axel NACKAERTS
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
WOUND MONITORING
- Publication number 20160228049
- Publication date Aug 11, 2016
- NXP B.V.
- Axel Nackaerts
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
METHOD OF MANUFACTURING AN INTEGRATED CIRCUIT COMPRISING A PRESSURE...
- Publication number 20160167957
- Publication date Jun 16, 2016
- ams International AG
- Axel NACKAERTS
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
ANALYTE DETECTION METHODS AND DEVICES
- Publication number 20150226736
- Publication date Aug 13, 2015
- NXP B.V.
- Viet Hoang Nguyen
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT WITH ION SENSITIVE SENSOR AND MANUFACTURING METHOD
- Publication number 20130334619
- Publication date Dec 19, 2013
- Matthias Merz
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT WITH PRESSURE SENSOR AND MANUFACTURING METHOD
- Publication number 20130328142
- Publication date Dec 12, 2013
- Axel Nackaerts
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Temperature Sensor, Electronic Device and Temperature Measurement M...
- Publication number 20130070807
- Publication date Mar 21, 2013
- NXP B.V.
- Youri Victorovitch Ponomarev
- G01 - MEASURING TESTING
Information Patent Application
Lighting System
- Publication number 20130057157
- Publication date Mar 7, 2013
- NXP B.V.
- Axel Nackaerts
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Sensor
- Publication number 20120286803
- Publication date Nov 15, 2012
- NXP B.V.
- Axel Nackaerts
- G01 - MEASURING TESTING
Information Patent Application
CAPACITIVE SENSOR, INTEGRATED CIRCUIT, ELECTRONIC DEVICE AND METHOD
- Publication number 20120256645
- Publication date Oct 11, 2012
- NXP B.V.
- Viet Hoang Nguyen
- G01 - MEASURING TESTING
Information Patent Application
SENSOR AND MEASUREMENT METHOD
- Publication number 20110175595
- Publication date Jul 21, 2011
- NXP B.V.
- Axel NACKAERTS
- G01 - MEASURING TESTING
Information Patent Application
Methods for Manufacturing Dense Integrated Circuits
- Publication number 20110084313
- Publication date Apr 14, 2011
- IMEC
- Liesbeth Witters
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MAKING QUANTUM DOTS
- Publication number 20090137102
- Publication date May 28, 2009
- Interuniversitair Microelektronica Centrum vzw (IMEC)
- Rita Rooyackers
- B82 - NANO-TECHNOLOGY
Information Patent Application
DESIGN OPTIMIZATION
- Publication number 20090112344
- Publication date Apr 30, 2009
- Interuniversitair Microelektronica Centrum vzw (IMEC)
- Axel Nackaerts
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Semiconductor device for measuring an overlay error, method for mea...
- Publication number 20080149925
- Publication date Jun 26, 2008
- ASML NETHERLANDS B.V.
- Mircea Dusa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Semiconductor device for measuring an overlay error, method for mea...
- Publication number 20080061291
- Publication date Mar 13, 2008
- ASML NETHERLANDS B.V.
- Mircea Dusa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Methods for manufacturing dense integrated circuits
- Publication number 20070172770
- Publication date Jul 26, 2007
- Liesbeth Witters
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for high topography patterning
- Publication number 20070140637
- Publication date Jun 21, 2007
- Staf Verhaegen
- H01 - BASIC ELECTRIC ELEMENTS

Axel Nackaerts

Person

Patents Grantslast 30 patents

Device for electromagnetic structural characterization

Segmented platform for items

Liquid exposure sensing device and controller

Wireless device

Buffer device, an electronic system, and a method for operating a b...

Integrated circuit with a pressure sensor

Substance detection device

Analyte detection methods and devices

Method of manufacturing an integrated circuit comprising a pressure...

Integrated circuit with pressure sensor having a pair of electrodes

Lighting system

Integrated circuit with ion sensitive sensor and manufacturing method

Sensor

Sensor and measurement method

Capacitive sensor, integrated circuit, electronic device and method

Optimization

Method for high topography patterning

Semiconductor device for measuring an overlay error, method for mea...

Method for making quantum dots

Semiconductor device for measuring an overlay error, method for mea...

Patents Applicationslast 30 patents

LIQUID EXPOSURE SENSING DEVICE AND CONTROLLER

DEVICE FOR ELECTROMAGNETIC STRUCTURAL CHARACTERIZATION

SEGMENTED PLATFORM FOR ITEMS

BUFFER DEVICE, AN ELECTRONIC SYSTEM, AND A METHOD FOR OPERATING A B...

SUBSTANCE DETECTION DEVICE

INTEGRATED CIRCUIT WITH A PRESSURE SENSOR

WOUND MONITORING

METHOD OF MANUFACTURING AN INTEGRATED CIRCUIT COMPRISING A PRESSURE...

ANALYTE DETECTION METHODS AND DEVICES

INTEGRATED CIRCUIT WITH ION SENSITIVE SENSOR AND MANUFACTURING METHOD

INTEGRATED CIRCUIT WITH PRESSURE SENSOR AND MANUFACTURING METHOD

Temperature Sensor, Electronic Device and Temperature Measurement M...

Lighting System

Sensor

CAPACITIVE SENSOR, INTEGRATED CIRCUIT, ELECTRONIC DEVICE AND METHOD

SENSOR AND MEASUREMENT METHOD

Methods for Manufacturing Dense Integrated Circuits

METHOD FOR MAKING QUANTUM DOTS

DESIGN OPTIMIZATION

Semiconductor device for measuring an overlay error, method for mea...

Semiconductor device for measuring an overlay error, method for mea...

Methods for manufacturing dense integrated circuits

Method for high topography patterning