Axel Schmidt

Person

Stolpchen, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Method for testing a test substrate under defined thermal condition...
- Patent number 9,395,411
- Issue date Jul 19, 2016
- Cascade Microtech, Inc.
- Joerg Kiesewetter
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing a test substrate under defined thermal condition...
- Patent number 8,497,693
- Issue date Jul 30, 2013
- Cascade Microtech, Inc.
- Joerg Kiesewetter
- G01 - MEASURING TESTING
Information Patent Grant
Probe station for on-wafer-measurement under EMI-shielding
- Patent number 8,344,744
- Issue date Jan 1, 2013
- Cascade Microtech, Inc.
- Axel Schmidt
- G01 - MEASURING TESTING
Information Patent Grant
Probe station for testing semiconductor substrates and comprising E...
- Patent number 8,278,951
- Issue date Oct 2, 2012
- Cascade Microtech, Inc.
- Stojan Kanev
- G01 - MEASURING TESTING
Information Patent Grant
Chuck with triaxial construction
- Patent number 8,240,650
- Issue date Aug 14, 2012
- Cascade Microtech, Inc.
- Michael Teich
- G01 - MEASURING TESTING
Information Patent Grant
Probe support with shield for the examination of test substrates un...
- Patent number 7,652,491
- Issue date Jan 26, 2010
- SUSS MicroTec Test Systems GmbH
- Stojan Kanev
- G01 - MEASURING TESTING
Information Patent Grant
Method for measurement of a device under test
- Patent number 7,573,283
- Issue date Aug 11, 2009
- SUSS Micro Tec Test Systems GmbH
- Axel Schmidt
- G01 - MEASURING TESTING
Information Patent Grant
Probe receptacle for mounting a probe for testing semiconductor com...
- Patent number 7,560,942
- Issue date Jul 14, 2009
- SUSS MicroTec Test Systems GmbH
- Hans-Jurgen Fleischer
- G01 - MEASURING TESTING
Information Patent Grant
Procedure for reproduction of a calibration position of an aligned...
- Patent number 7,265,536
- Issue date Sep 4, 2007
- SUSS MicroTec Test Systems GmbH
- Joerg Kiesewetter
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus for testing substrates at low temperatures
- Patent number 7,046,025
- Issue date May 16, 2006
- SUSS MicroTec Testsystems GmbH
- Stefan Schneidewind
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR TESTING A TEST SUBSTRATE UNDER DEFINED THERMAL CONDITION...
- Publication number 20140028337
- Publication date Jan 30, 2014
- Cascade Microtech, Inc.
- Joerg Kiesewetter
- G01 - MEASURING TESTING
Information Patent Application
PROBE STATION FOR ON-WAFER-MEASUREMENT UNDER EMI-SHIELDING
- Publication number 20110227602
- Publication date Sep 22, 2011
- CASCADE MICROTECH DRESDEN GMBH
- Axel SCHMIDT
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR TESTING A TEST SUBSTRATE UNDER DEFINED THERMAL CONDITION...
- Publication number 20100289511
- Publication date Nov 18, 2010
- SUSS MicroTec Test Systems GmbH
- Joerg Kiesewetter
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASUREMENT OF A DEVICE UNDER TEST
- Publication number 20080315903
- Publication date Dec 25, 2008
- SUSS MicroTec Test Systems GmbH
- Axel SCHMIDT
- G01 - MEASURING TESTING
Information Patent Application
CHUCK WITH TRIAXIAL CONSTRUCTION
- Publication number 20080224426
- Publication date Sep 18, 2008
- SUSS MicroTec Test Systems GmbH
- Michael TEICH
- G01 - MEASURING TESTING
Information Patent Application
PROBE SUPPORT AND PROCESS FOR THE EXAMINATION OF TEST SUBSTRATES UN...
- Publication number 20080116917
- Publication date May 22, 2008
- SUSS MicroTec Test Systems GmbH
- Stojan Kanev
- G01 - MEASURING TESTING
Information Patent Application
PROBE STATION TO TESTING SEMICONDUCTOR SUBSTRATES AND COMPRISING EM...
- Publication number 20080116918
- Publication date May 22, 2008
- SUSS MicroTec Test Systems GmbH
- Stojan Kanev
- G01 - MEASURING TESTING
Information Patent Application
PROBE RECEPTACLE FOR MOUNTING A PROBE FOR TESTING SEMICONDUCTOR COM...
- Publication number 20080116911
- Publication date May 22, 2008
- SUSS MicroTec Test Systems GmbH
- Hans-Jurgen FLEISCHER
- G01 - MEASURING TESTING
Information Patent Application
Procedure for reproduction of a calibration position of an aligned...
- Publication number 20060212248
- Publication date Sep 21, 2006
- SUSS MicroTec Test Systems GmbH
- Joerg Kiesewetter
- G01 - MEASURING TESTING
Information Patent Application
Test apparatus for testing substrates at low temperatures
- Publication number 20040070415
- Publication date Apr 15, 2004
- Stefan Schneidewind
- G01 - MEASURING TESTING

Axel Schmidt

Person

Patents Grantslast 30 patents

Method for testing a test substrate under defined thermal condition...

Method for testing a test substrate under defined thermal condition...

Probe station for on-wafer-measurement under EMI-shielding

Probe station for testing semiconductor substrates and comprising E...

Chuck with triaxial construction

Probe support with shield for the examination of test substrates un...

Method for measurement of a device under test

Probe receptacle for mounting a probe for testing semiconductor com...

Procedure for reproduction of a calibration position of an aligned...

Test apparatus for testing substrates at low temperatures

Patents Applicationslast 30 patents

METHOD FOR TESTING A TEST SUBSTRATE UNDER DEFINED THERMAL CONDITION...

PROBE STATION FOR ON-WAFER-MEASUREMENT UNDER EMI-SHIELDING

METHOD FOR TESTING A TEST SUBSTRATE UNDER DEFINED THERMAL CONDITION...

METHOD FOR MEASUREMENT OF A DEVICE UNDER TEST

CHUCK WITH TRIAXIAL CONSTRUCTION

PROBE SUPPORT AND PROCESS FOR THE EXAMINATION OF TEST SUBSTRATES UN...

PROBE STATION TO TESTING SEMICONDUCTOR SUBSTRATES AND COMPRISING EM...

PROBE RECEPTACLE FOR MOUNTING A PROBE FOR TESTING SEMICONDUCTOR COM...

Procedure for reproduction of a calibration position of an aligned...

Test apparatus for testing substrates at low temperatures