Aya Kuribayashi

Person

  • Tokyo, JP

Patents Grantslast 30 patents

  • Information Patent Grant

    X-ray analysis apparatus

    • Patent number 7,711,091
    • Issue date May 4, 2010
    • Rigaku Corporation
    • Akito Sasaki
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    X-ray analysis apparatus

    • Publication number 20080056452
    • Publication date Mar 6, 2008
    • Rigaku Corporation
    • Akito Sasaki
    • G01 - MEASURING TESTING