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Aya Kuribayashi
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Tokyo, JP
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Patents Grants
last 30 patents
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Patent Grant
X-ray analysis apparatus
Patent number
7,711,091
Issue date
May 4, 2010
Rigaku Corporation
Akito Sasaki
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
X-ray analysis apparatus
Publication number
20080056452
Publication date
Mar 6, 2008
Rigaku Corporation
Akito Sasaki
G01 - MEASURING TESTING