Ayako Nakamura

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Kawasaki, JP

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Patents Grantslast 30 patents

Information Patent Grant
Optical characteristic measuring method, optical characteristic adj...
- Patent number 10,222,293
- Issue date Mar 5, 2019
- Nikon Corporation
- Hiroshi Ooki
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Position detection apparatus and method
- Patent number 6,668,075
- Issue date Dec 23, 2003
- Nikon Corporation
- Ayako Nakamura
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Optical characteristic measuring method, optical characteristic adj...
- Publication number 20100195072
- Publication date Aug 5, 2010
- Nikon Corporation
- Hiroshi Ooki
- G01 - MEASURING TESTING
Information Patent Application
Optical characteristic measuring method, optical characteristic adj...
- Publication number 20100177290
- Publication date Jul 15, 2010
- Nikon Corporation
- Kiyoshi Toyama
- G01 - MEASURING TESTING
Information Patent Application
Exposure Method and Apparatus, and Electronic Device Manufacturing...
- Publication number 20090011368
- Publication date Jan 8, 2009
- Yutaka Ichihara
- G02 - OPTICS