Ayako Shimazaki

Person

Yokohama, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method and device for dissolving surface layer of semiconductor sub...
- Patent number 5,890,501
- Issue date Apr 6, 1999
- Kabushiki Kaisha Toshiba
- Minako Kaneko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fluorescent X-ray analyzing apparatus
- Patent number 5,732,120
- Issue date Mar 24, 1998
- Rigaku Industrial Corporation
- Takashi Shoji
- G01 - MEASURING TESTING
Information Patent Grant
Method for analying an impurity on a semiconductor substrate
- Patent number 5,633,172
- Issue date May 27, 1997
- Kabushiki Kaisha Toshiba
- Ayako Shimazaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for analyzing contaminative element concentrat...
- Patent number 5,528,648
- Issue date Jun 18, 1996
- Kabushiki Kaisha Toshiba
- Fumio Komatsu
- G01 - MEASURING TESTING
Information Patent Grant
Contaminating-element analyzing method
- Patent number 5,497,407
- Issue date Mar 5, 1996
- Kabushiki Kaisha Toshiba
- Fumio Komatsu
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for analyzing contaminative element concentrat...
- Patent number 5,490,194
- Issue date Feb 6, 1996
- Kabushiki Kaisha Toshiba
- Fumio Komatsu
- G01 - MEASURING TESTING
Information Patent Grant
Element analyzing method
- Patent number 5,430,786
- Issue date Jul 4, 1995
- Kabushiki Kaisha Toshiba
- Fumio Komatsu
- G01 - MEASURING TESTING
Information Patent Grant
Contaminating-element analyzing method and apparatus of the same
- Patent number 5,422,925
- Issue date Jun 6, 1995
- Kabushiki Kaisha Toshiba
- Fumio Komatsu
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor treatment apparatus
- Patent number 5,395,446
- Issue date Mar 7, 1995
- Kabushiki Kaisha Toshiba
- Mokuji Kageyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing semiconductor devices including depositing...
- Patent number 5,290,733
- Issue date Mar 1, 1994
- Kabushiki Kaisha Toshiba
- Nobuo Hayasaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for decomposing semiconductor thin film
- Patent number 4,634,497
- Issue date Jan 6, 1987
- Kabushiki Kaisha Toshiba
- Ayako Shimazaki
- H01 - BASIC ELECTRIC ELEMENTS

Ayako Shimazaki

Person

Patents Grantslast 30 patents

Method and device for dissolving surface layer of semiconductor sub...

Fluorescent X-ray analyzing apparatus

Method for analying an impurity on a semiconductor substrate

Method and apparatus for analyzing contaminative element concentrat...

Contaminating-element analyzing method

Method and apparatus for analyzing contaminative element concentrat...

Element analyzing method

Contaminating-element analyzing method and apparatus of the same

Semiconductor treatment apparatus

Method of manufacturing semiconductor devices including depositing...

Method and apparatus for decomposing semiconductor thin film