Ayelet Dag

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Haifa, IL

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Patents Grantslast 30 patents

Information Patent Grant
Combining X-ray and VUV analysis of thin film layers
- Patent number 8,565,379
- Issue date Oct 22, 2013
- Jordan Valley Semiconductors Ltd.
- Isaac Mazor
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Combining X-ray and VUV Analysis of Thin Film Layers
- Publication number 20120275568
- Publication date Nov 1, 2012
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Isaac Mazor
- G01 - MEASURING TESTING