Ayumi DOI

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Pattern evaluation system and pattern evaluation method
- Patent number 11,428,652
- Issue date Aug 30, 2022
- HITACHI HIGH-TECH CORPORATION
- Koichiro Irie
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pattern evaluation device
- Patent number 10,854,420
- Issue date Dec 1, 2020
- HITACHI HIGH-TECH CORPORATION
- Miki Isawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Sample observation device having a selectable acceleration voltage
- Patent number 10,141,159
- Issue date Nov 27, 2018
- Hitachi High-Technologies Corporation
- Ayumi Doi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Control circuit apparatus and endoscope apparatus
- Patent number 9,451,215
- Issue date Sep 20, 2016
- Olympus Corporation
- Ayumi Doi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
Depth Measurement Device, Depth Measurement System, and Depth Index...
- Publication number 20240240937
- Publication date Jul 18, 2024
- Hitachi High-Tech Corporation
- Aoi YAMAUCHI
- G01 - MEASURING TESTING
Information Patent Application
Charged Particle Beam Device, Charged Particle Beam System, and Adj...
- Publication number 20230386781
- Publication date Nov 30, 2023
- HITACHI HIGH-TECH CORPORATION
- Zhao JINYU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Structure Estimation System and Structure Estimation Program
- Publication number 20220130027
- Publication date Apr 28, 2022
- Hitachi High-Tech Corporation
- Muneyuki FUKUDA
- G01 - MEASURING TESTING
Information Patent Application
Pattern Measurement Method, Measurement System, and Computer-Readab...
- Publication number 20210404801
- Publication date Dec 30, 2021
- Ayumi DOI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Pattern Evaluation System and Pattern Evaluation Method
- Publication number 20200363350
- Publication date Nov 19, 2020
- HITACHI HIGH-TECH CORPORATION
- Koichiro IRIE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PATTERN EVALUATION DEVICE
- Publication number 20200098543
- Publication date Mar 26, 2020
- Miki ISAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Sample Observation Device
- Publication number 20150371816
- Publication date Dec 24, 2015
- Hitachi High-Technologies Corporation
- Ayumi DOI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONTROL CIRCUIT APPARATUS AND ENDOSCOPE APPARATUS
- Publication number 20130169776
- Publication date Jul 4, 2013
- OLYMPUS CORPORATION
- Ayumi DOI
- G02 - OPTICS
Information Patent Application
ENDOSCOPE APPARATUS
- Publication number 20130100274
- Publication date Apr 25, 2013
- OLYMPUS CORPORATION
- AYUMI DOI
- G02 - OPTICS

Person

Patents Grantslast 30 patents

Pattern evaluation system and pattern evaluation method

Pattern evaluation device

Sample observation device having a selectable acceleration voltage

Control circuit apparatus and endoscope apparatus

Patents Applicationslast 30 patents

Depth Measurement Device, Depth Measurement System, and Depth Index...

Charged Particle Beam Device, Charged Particle Beam System, and Adj...

Structure Estimation System and Structure Estimation Program

Pattern Measurement Method, Measurement System, and Computer-Readab...

Pattern Evaluation System and Pattern Evaluation Method

PATTERN EVALUATION DEVICE

Sample Observation Device

CONTROL CIRCUIT APPARATUS AND ENDOSCOPE APPARATUS

ENDOSCOPE APPARATUS