Ayumi MASADA

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Saga, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method of measuring carbon concentration of silicon sample, method...
- Patent number 10,935,510
- Issue date Mar 2, 2021
- Sumco Corporation
- Kazutaka Eriguchi
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing epitaxial silicon wafer, epitaxial silicon...
- Patent number 10,872,768
- Issue date Dec 22, 2020
- Sumco Corporation
- Ayumi Masada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of evaluating manufacturing process of silicon material and...
- Patent number 10,676,840
- Issue date Jun 9, 2020
- Sumco Corporation
- Noritomo Mitsugi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF MANUFACTURING EPITAXIAL SILICON WAFER, EPITAXIAL SILICON...
- Publication number 20190189442
- Publication date Jun 20, 2019
- SUMCO CORPORATION
- Ayumi MASADA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MEASURING CARBON CONCENTRATION OF SILICON SAMPLE, METHOD...
- Publication number 20190064098
- Publication date Feb 28, 2019
- SUMCO CORPORATION
- Kazutaka ERIGUCHI
- C30 - CRYSTAL GROWTH
Information Patent Application
METHOD OF EVALUATING MANUFACTURING PROCESS OF SILICON MATERIAL AND...
- Publication number 20180179661
- Publication date Jun 28, 2018
- SUMCO CORPORATION
- Noritomo MITSUGI
- C30 - CRYSTAL GROWTH