Ayumu Taguchi

Person

Kanagawa, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Information processing apparatus, information processing method, in...
- Patent number 12,163,886
- Issue date Dec 10, 2024
- Sony Group Corporation
- Kazuhiro Nakagawa
- G01 - MEASURING TESTING
Information Patent Grant
Information processing apparatus and microscope system
- Patent number 11,761,895
- Issue date Sep 19, 2023
- Sony Group Corporation
- Kenji Ikeda
- G01 - MEASURING TESTING
Information Patent Grant
Information processing apparatus, information processing method, in...
- Patent number 11,579,090
- Issue date Feb 14, 2023
- Sony Corporation
- Kazuhiro Nakagawa
- G01 - MEASURING TESTING
Information Patent Grant
Image sensor, production method therefor, and inspection apparatus
- Patent number 9,324,751
- Issue date Apr 26, 2016
- Sony Corporation
- Ayumu Taguchi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Object detection system and object detection method
- Patent number 8,243,288
- Issue date Aug 14, 2012
- Sony Corporation
- Ayumu Taguchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Aggregate of electronic device chips, electronic device chip, aggre...
- Patent number 7,466,470
- Issue date Dec 16, 2008
- Sony Corporation
- Ayumu Taguchi
- G02 - OPTICS
Information Patent Grant
Optical modulation device and image display apparatus using the same
- Patent number 7,369,289
- Issue date May 6, 2008
- Sony Corporation
- Hitoshi Tamada
- G02 - OPTICS
Information Patent Grant
Light reflection/diffraction device, light reflection/diffraction d...
- Patent number 6,987,616
- Issue date Jan 17, 2006
- Sony Corporation
- Hitoshi Tamada
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Polysilicon evaluating method, polysilicon inspection apparatus and...
- Patent number 6,933,185
- Issue date Aug 23, 2005
- Sony Corporation
- Hiroyuki Wada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrostatic machine element, light diffraction modulation element...
- Patent number 6,813,061
- Issue date Nov 2, 2004
- Sony Corporation
- Ayumu Taguchi
- G02 - OPTICS
Information Patent Grant
Inspection apparatus and method
- Patent number 6,559,937
- Issue date May 6, 2003
- Sony Corporation
- Hitoshi Tamada
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and method
- Patent number 6,451,492
- Issue date Sep 17, 2002
- Sony Corporation
- Yutaka Imai
- G01 - MEASURING TESTING
Information Patent Grant
Optical device having domain structure and method for manufacturing...
- Patent number 5,249,250
- Issue date Sep 28, 1993
- Sony Corporation
- Masahiro Yamada
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
INFORMATION PROCESSING APPARATUS AND MICROSCOPE SYSTEM
- Publication number 20240027348
- Publication date Jan 25, 2024
- SONY GROUP CORPORATION
- Kenji Ikeda
- G01 - MEASURING TESTING
Information Patent Application
FLUORESCENCE OBSERVATION APPARATUS, FLUORESCENCE OBSERVATION SYSTEM...
- Publication number 20230213450
- Publication date Jul 6, 2023
- SONY GROUP CORPORATION
- AYUMU TAGUCHI
- G01 - MEASURING TESTING
Information Patent Application
INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, IN...
- Publication number 20230152231
- Publication date May 18, 2023
- SONY GROUP CORPORATION
- Kazuhiro Nakagawa
- G01 - MEASURING TESTING
Information Patent Application
INFORMATION PROCESSING APPARATUS AND MICROSCOPE SYSTEM
- Publication number 20210396675
- Publication date Dec 23, 2021
- SONY GROUP CORPORATION
- Kenji Ikeda
- G01 - MEASURING TESTING
Information Patent Application
INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, IN...
- Publication number 20210325307
- Publication date Oct 21, 2021
- SONY CORPORATION
- Kazuhiro Nakagawa
- G01 - MEASURING TESTING
Information Patent Application
EMISSION INTENSITY MEASURING DEVICE
- Publication number 20150204786
- Publication date Jul 23, 2015
- SONY CORPORATION
- Ayumu Taguchi
- G01 - MEASURING TESTING
Information Patent Application
IMAGE SENSOR, PRODUCTION METHOD THEREFOR, AND INSPECTION APPARATUS
- Publication number 20140118590
- Publication date May 1, 2014
- SONY CORPORATION
- Ayumu Taguchi
- G01 - MEASURING TESTING
Information Patent Application
EMISSION INTENSITY MEASURING DEVICE
- Publication number 20120196775
- Publication date Aug 2, 2012
- SONY CORPORATION
- Ayumu Taguchi
- G01 - MEASURING TESTING
Information Patent Application
IMAGE SENSOR AND METHOD OF MANUFACTURING THE SAME, AND SENSOR DEVICE
- Publication number 20110157446
- Publication date Jun 30, 2011
- SONY CORPORATION
- Hiroto Kasai
- G01 - MEASURING TESTING
Information Patent Application
OBJECT DETECTION SYSTEM AND OBJECT DETECTION METHOD
- Publication number 20110019203
- Publication date Jan 27, 2011
- SONY CORPORATION
- Ayumu Taguchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Aggregate of electronic device chips, electronic device chip, aggre...
- Publication number 20060056001
- Publication date Mar 16, 2006
- Ayumu Taguchi
- G02 - OPTICS
Information Patent Application
Optical modulation device and image display apparatus using the same
- Publication number 20050007643
- Publication date Jan 13, 2005
- Hitoshi Tamada
- G02 - OPTICS
Information Patent Application
Light reflection/diffraction device, light reflection/diffraction d...
- Publication number 20040246559
- Publication date Dec 9, 2004
- Hitoshi Tamada
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Electrostatic machine element, light diffraction modulation element...
- Publication number 20040032654
- Publication date Feb 19, 2004
- Ayumu Taguchi
- G02 - OPTICS
Information Patent Application
Polysilicon evaluating method, polysilicon inspection apparatus and...
- Publication number 20030183853
- Publication date Oct 2, 2003
- Hiroyuki Wada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Polysilicon evaluating method, polysilicon inspection apparatus and...
- Publication number 20010038105
- Publication date Nov 8, 2001
- Hiroyuki Wada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Inspection apparatus and method
- Publication number 20010021014
- Publication date Sep 13, 2001
- Hitoshi Tamada
- G01 - MEASURING TESTING
Information Patent Application
Inspection apparatus and method
- Publication number 20010015410
- Publication date Aug 23, 2001
- Yutaka Imai
- G01 - MEASURING TESTING

Ayumu Taguchi

Person

Patents Grantslast 30 patents

Information processing apparatus, information processing method, in...

Information processing apparatus and microscope system

Information processing apparatus, information processing method, in...

Image sensor, production method therefor, and inspection apparatus

Object detection system and object detection method

Aggregate of electronic device chips, electronic device chip, aggre...

Optical modulation device and image display apparatus using the same

Light reflection/diffraction device, light reflection/diffraction d...

Polysilicon evaluating method, polysilicon inspection apparatus and...

Electrostatic machine element, light diffraction modulation element...

Inspection apparatus and method

Inspection apparatus and method

Optical device having domain structure and method for manufacturing...

Patents Applicationslast 30 patents

INFORMATION PROCESSING APPARATUS AND MICROSCOPE SYSTEM

FLUORESCENCE OBSERVATION APPARATUS, FLUORESCENCE OBSERVATION SYSTEM...

INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, IN...

INFORMATION PROCESSING APPARATUS AND MICROSCOPE SYSTEM

INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, IN...

EMISSION INTENSITY MEASURING DEVICE

IMAGE SENSOR, PRODUCTION METHOD THEREFOR, AND INSPECTION APPARATUS

EMISSION INTENSITY MEASURING DEVICE

IMAGE SENSOR AND METHOD OF MANUFACTURING THE SAME, AND SENSOR DEVICE

OBJECT DETECTION SYSTEM AND OBJECT DETECTION METHOD

Aggregate of electronic device chips, electronic device chip, aggre...

Optical modulation device and image display apparatus using the same

Light reflection/diffraction device, light reflection/diffraction d...

Electrostatic machine element, light diffraction modulation element...

Polysilicon evaluating method, polysilicon inspection apparatus and...

Polysilicon evaluating method, polysilicon inspection apparatus and...

Inspection apparatus and method

Inspection apparatus and method