Babji Vallabhaneni

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Santa Clara, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Virtualized scan chain testing in a random access memory (RAM) array
- Patent number 12,087,383
- Issue date Sep 10, 2024
- Ampere Computing LLC
- David Hoff
- G11 - INFORMATION STORAGE
Information Patent Grant
Method to dynamically inject errors in a repairable memory on silic...
- Patent number 10,204,698
- Issue date Feb 12, 2019
- Ampere Computing LLC
- Waseem Kraipak
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
VIRTUALIZED SCAN CHAIN TESTING IN A RANDOM ACCESS MEMORY (RAM) ARRAY
- Publication number 20240006012
- Publication date Jan 4, 2024
- Ampere Computing LLC
- David Hoff
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD TO DYNAMICALLY INJECT ERRORS IN A REPAIRABLE MEMORY ON SILIC...
- Publication number 20180174665
- Publication date Jun 21, 2018
- Ampere Computing LLC
- Waseem Kraipak
- G11 - INFORMATION STORAGE