Bae-Ki Lee

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Cheonan-si, KR

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Patents Grantslast 30 patents

Information Patent Grant
System for testing semiconductor modules
- Patent number 9,134,365
- Issue date Sep 15, 2015
- Samsung Electronics Co., Ltd.
- Min-Woo Kim
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM FOR TESTING SEMICONDUCTOR MODULES
- Publication number 20140166544
- Publication date Jun 19, 2014
- Samsung Electronics Co., Ltd.
- Min-Woo Kim
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS TO TEST SEMICONDUCTOR DEVICE AND METHOD OF TESTING SEMICO...
- Publication number 20100125377
- Publication date May 20, 2010
- SAMSUNG ELECTRONICS CO., LTD.
- Min-Woo KIM
- G05 - CONTROLLING REGULATING