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Baek-man SUNG
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Seoul, KR
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last 30 patents
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Patent Grant
Conductive atomic force microscope and method of operating the same
Patent number
9,261,532
Issue date
Feb 16, 2016
Samsung Electronics Co., Ltd.
Hyun-woo Kim
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
CONDUCTIVE ATOMIC FORCE MICROSCOPE AND METHOD OF OPERATING THE SAME
Publication number
20160033550
Publication date
Feb 4, 2016
Samsung Electronics Co., Ltd.
Hyun-woo KIM
G01 - MEASURING TESTING