Bahadir Tunaboylu

Person

Gilbert, AZ, US

People

Patents Grantslast 30 patents

Information Patent Grant
Modular space transformer for fine pitch vertical probing applications
- Patent number 8,430,676
- Issue date Apr 30, 2013
- SV Probe Pte. Ltd.
- Son Dang
- G01 - MEASURING TESTING
Information Patent Grant
Approach for assembling and repairing probe assemblies using laser...
- Patent number 8,299,394
- Issue date Oct 30, 2012
- SV Probe Pte. Ltd.
- Senthil Theppakuttai
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Probe card assembly with interposer probes
- Patent number 8,058,887
- Issue date Nov 15, 2011
- SV Probe Pte. Ltd.
- Bahadir Tunaboylu
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever probe structure for a probe card assembly
- Patent number 8,004,299
- Issue date Aug 23, 2011
- SV Probe Pte. Ltd.
- Scott R. Williams
- G01 - MEASURING TESTING
Information Patent Grant
Probe card with stacked substrate
- Patent number 7,898,276
- Issue date Mar 1, 2011
- SV Probe Pte. Ltd.
- Scott R. Williams
- G01 - MEASURING TESTING
Information Patent Grant
Low force interconnects for probe cards
- Patent number 7,733,104
- Issue date Jun 8, 2010
- SV Probe Pte. Ltd.
- John McGlory
- G01 - MEASURING TESTING
Information Patent Grant
Approach for fabricating cantilever probes
- Patent number 7,721,430
- Issue date May 25, 2010
- SV Probe Pte. Ltd.
- Dov Chartarifsky
- G01 - MEASURING TESTING
Information Patent Grant
Probe card assembly and method of attaching probes to the probe car...
- Patent number 7,675,302
- Issue date Mar 9, 2010
- SV Probe Pte. Ltd.
- Bahadir Tunaboylu
- G01 - MEASURING TESTING
Information Patent Grant
Beam assembly method for large area array multi-beam DUT probe cards
- Patent number 7,637,006
- Issue date Dec 29, 2009
- SV Probe Pte. Ltd.
- Bahadir Tunaboylu
- G01 - MEASURING TESTING
Information Patent Grant
Approach for fabricating cantilever probes for probe card assemblies
- Patent number 7,637,007
- Issue date Dec 29, 2009
- SV Probe Pte. Ltd.
- Bahadir Tunaboylu
- G01 - MEASURING TESTING
Information Patent Grant
Probe tip plating
- Patent number 7,638,028
- Issue date Dec 29, 2009
- SV Probe Pte. Ltd.
- Bahadir Tunaboylu
- G01 - MEASURING TESTING
Information Patent Grant
Automated probe card planarization and alignment methods and tools
- Patent number 7,583,098
- Issue date Sep 1, 2009
- SV Probe Pte. Ltd.
- Bahadir Tunaboylu
- G01 - MEASURING TESTING
Information Patent Grant
Probe card assembly with a dielectric strip structure coupled to a...
- Patent number 7,495,459
- Issue date Feb 24, 2009
- SV Probe Pte. Ltd.
- Bahadir Tunaboylu
- G01 - MEASURING TESTING
Information Patent Grant
Method of shaping lithographically-produced probe elements
- Patent number 7,462,800
- Issue date Dec 9, 2008
- SV Probe Pte. Ltd.
- Bahadir Tunaboylu
- G01 - MEASURING TESTING
Information Patent Grant
Probe repair methods
- Patent number 7,437,813
- Issue date Oct 21, 2008
- SV Probe Pte. Ltd.
- Bahadir Tunaboylu
- G01 - MEASURING TESTING
Information Patent Grant
Blade probe and blade probe card
- Patent number 7,432,728
- Issue date Oct 7, 2008
- SV Probe Pte. Ltd.
- Habib Kilicaslan
- G01 - MEASURING TESTING
Information Patent Grant
Probe pad structure in a ceramic space transformer
- Patent number 7,374,811
- Issue date May 20, 2008
- SV Probe Pte. Ltd.
- Chi Shih Chang
- G01 - MEASURING TESTING
Information Patent Grant
Probe card assembly with dielectric structure
- Patent number 7,279,911
- Issue date Oct 9, 2007
- SV Probe Pte. Ltd.
- Bahadir Tunaboylu
- G01 - MEASURING TESTING
Information Patent Grant
Probe card assembly and method of attaching probes to the probe car...
- Patent number 7,271,602
- Issue date Sep 18, 2007
- SV Probe Pte. Ltd.
- Bahadir Tunaboylu
- G01 - MEASURING TESTING
Information Patent Grant
Method of probe tip shaping and cleaning
- Patent number 7,182,672
- Issue date Feb 27, 2007
- SV Probe Pte. Ltd.
- Bahadir Tunaboylu
- B24 - GRINDING POLISHING
Information Patent Grant
Substrate with patterned conductive layer
- Patent number 7,180,315
- Issue date Feb 20, 2007
- SV Probe, Ltd.
- Bahadir Tunaboylu
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for probe tip cleaning and shaping pad
- Patent number 6,908,364
- Issue date Jun 21, 2005
- Kulicke and Soffa Industries, Inc.
- Gerald W. Back
- B24 - GRINDING POLISHING

Patents Applicationslast 30 patents

Information Patent Application
CANTILEVER PROBE STRUCTURE FOR A PROBE CARD ASSEMBLY
- Publication number 20110148449
- Publication date Jun 23, 2011
- Scott R. Williams
- G01 - MEASURING TESTING
Information Patent Application
Modular Space Transformer For Fine Pitch Vertical Probing Applications
- Publication number 20110032063
- Publication date Feb 10, 2011
- Son Dang
- G01 - MEASURING TESTING
Information Patent Application
Probe Test Card with Flexible Interconnect Structure
- Publication number 20100176831
- Publication date Jul 15, 2010
- William M. Palcisko
- G01 - MEASURING TESTING
Information Patent Application
Low Force Interconnects For Probe Cards
- Publication number 20090261849
- Publication date Oct 22, 2009
- John McGlory
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD ASSEMBLY WITH INTERPOSER PROBES
- Publication number 20090184725
- Publication date Jul 23, 2009
- Bahadir Tunaboylu
- G01 - MEASURING TESTING
Information Patent Application
Bond Reinforcement Layer for Probe Test Cards
- Publication number 20090174423
- Publication date Jul 9, 2009
- Peter J. Klaerner
- G01 - MEASURING TESTING
Information Patent Application
Approach for assembling and repairing probe assemblies using laser...
- Publication number 20080308536
- Publication date Dec 18, 2008
- SV Probe Pte Ltd
- Senthil Theppakuttai
- G01 - MEASURING TESTING
Information Patent Application
Probe Card With Stacked Substrate
- Publication number 20080246501
- Publication date Oct 9, 2008
- Scott R. Williams
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD ASSEMBLY WITH A DIELECTRIC STRIP STRUCTURE
- Publication number 20080024148
- Publication date Jan 31, 2008
- Bahadir Tunaboylu
- G01 - MEASURING TESTING
Information Patent Application
Probe Card Assembly and Method of Attaching Probes to the Probe Car...
- Publication number 20070279076
- Publication date Dec 6, 2007
- Bahadir Tunaboylu
- G01 - MEASURING TESTING
Information Patent Application
Approach for fabricating cantilever probes
- Publication number 20070256299
- Publication date Nov 8, 2007
- Dov Chartarifsky
- G01 - MEASURING TESTING
Information Patent Application
Beam assembly method for large area array multi-beam DUT probe cards
- Publication number 20070251080
- Publication date Nov 1, 2007
- Bahadir Tunaboylu
- G01 - MEASURING TESTING
Information Patent Application
Automated probe card planarization and alignment methods and tools
- Publication number 20070216431
- Publication date Sep 20, 2007
- Bahadir Tunaboylu
- G01 - MEASURING TESTING
Information Patent Application
Blade probe and blade probe card
- Publication number 20070210815
- Publication date Sep 13, 2007
- Habib Kilicaslan
- G01 - MEASURING TESTING
Information Patent Application
Approach for fabricating cantilever probes for probe card assemblies
- Publication number 20070202658
- Publication date Aug 30, 2007
- Bahadir Tunaboylu
- G01 - MEASURING TESTING
Information Patent Application
Probe repair methods
- Publication number 20070200577
- Publication date Aug 30, 2007
- Bahadir Tunaboylu
- G01 - MEASURING TESTING
Information Patent Application
Multi-layered probes
- Publication number 20070200576
- Publication date Aug 30, 2007
- Edward T. Laurent
- G01 - MEASURING TESTING
Information Patent Application
Cantilever probe structure for a probe card assembly
- Publication number 20070089551
- Publication date Apr 26, 2007
- SV Probe Ptd. Ltd.
- Scott R. Williams
- G01 - MEASURING TESTING
Information Patent Application
Probe pad structure in a ceramic space transformer
- Publication number 20060257631
- Publication date Nov 16, 2006
- Chi Shih Chang
- G01 - MEASURING TESTING
Information Patent Application
Probe card assembly with dielectric structure
- Publication number 20060250150
- Publication date Nov 9, 2006
- K&S Interconnect, Inc.
- Bahadir Tunaboylu
- G01 - MEASURING TESTING
Information Patent Application
Probe card assembly and method of attaching probes to the probe car...
- Publication number 20060181292
- Publication date Aug 17, 2006
- K&S Interconnect, Inc.
- Bahadir Tunaboylu
- G01 - MEASURING TESTING
Information Patent Application
Method of shaping lithographically-produced probe elements
- Publication number 20060119376
- Publication date Jun 8, 2006
- K&S Interconnect, Inc.
- Bahadir Tunaboylu
- G01 - MEASURING TESTING
Information Patent Application
Probe tip plating
- Publication number 20060027747
- Publication date Feb 9, 2006
- K&S Interconnect, Inc.
- Bahadir Tunaboylu
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Application
Reinforced probes for testing semiconductor devices
- Publication number 20060028220
- Publication date Feb 9, 2006
- K&S Interconnect, Inc.
- Edward L. Malantonio
- G01 - MEASURING TESTING
Information Patent Application
Substrate with patterned conductive layer
- Publication number 20050287789
- Publication date Dec 29, 2005
- Bahadir Tunaboylu
- G01 - MEASURING TESTING
Information Patent Application
Method of probe tip shaping and cleaning
- Publication number 20050260937
- Publication date Nov 24, 2005
- K&S Interconnect, Inc.
- Bahadir Tunaboylu
- B24 - GRINDING POLISHING
Information Patent Application
Method and apparatus for probe tip cleaning and shaping pad
- Publication number 20030027496
- Publication date Feb 6, 2003
- Gerald W. Back
- B24 - GRINDING POLISHING

Bahadir Tunaboylu

Person

Patents Grantslast 30 patents

Modular space transformer for fine pitch vertical probing applications

Approach for assembling and repairing probe assemblies using laser...

Probe card assembly with interposer probes

Cantilever probe structure for a probe card assembly

Probe card with stacked substrate

Low force interconnects for probe cards

Approach for fabricating cantilever probes

Probe card assembly and method of attaching probes to the probe car...

Beam assembly method for large area array multi-beam DUT probe cards

Approach for fabricating cantilever probes for probe card assemblies

Probe tip plating

Automated probe card planarization and alignment methods and tools

Probe card assembly with a dielectric strip structure coupled to a...

Method of shaping lithographically-produced probe elements

Probe repair methods

Blade probe and blade probe card

Probe pad structure in a ceramic space transformer

Probe card assembly with dielectric structure

Probe card assembly and method of attaching probes to the probe car...

Method of probe tip shaping and cleaning

Substrate with patterned conductive layer

Method and apparatus for probe tip cleaning and shaping pad

Patents Applicationslast 30 patents

CANTILEVER PROBE STRUCTURE FOR A PROBE CARD ASSEMBLY

Modular Space Transformer For Fine Pitch Vertical Probing Applications

Probe Test Card with Flexible Interconnect Structure

Low Force Interconnects For Probe Cards

PROBE CARD ASSEMBLY WITH INTERPOSER PROBES

Bond Reinforcement Layer for Probe Test Cards

Approach for assembling and repairing probe assemblies using laser...

Probe Card With Stacked Substrate

PROBE CARD ASSEMBLY WITH A DIELECTRIC STRIP STRUCTURE

Probe Card Assembly and Method of Attaching Probes to the Probe Car...

Approach for fabricating cantilever probes

Beam assembly method for large area array multi-beam DUT probe cards

Automated probe card planarization and alignment methods and tools

Blade probe and blade probe card

Approach for fabricating cantilever probes for probe card assemblies

Probe repair methods

Multi-layered probes

Cantilever probe structure for a probe card assembly

Probe pad structure in a ceramic space transformer

Probe card assembly with dielectric structure

Probe card assembly and method of attaching probes to the probe car...

Method of shaping lithographically-produced probe elements

Probe tip plating

Reinforced probes for testing semiconductor devices

Substrate with patterned conductive layer

Method of probe tip shaping and cleaning

Method and apparatus for probe tip cleaning and shaping pad