Balaji Natarajan

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Santa Clara, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Configurable built in self test circuitry for testing memory arrays
- Patent number 7,475,315
- Issue date Jan 6, 2009
- Altera Corporation
- Balaji Natarajan
- G11 - INFORMATION STORAGE
Information Patent Grant
Built-in self-test circuitry for integrated circuits
- Patent number 7,005,875
- Issue date Feb 28, 2006
- Altera Corporation
- Balaji Natarajan
- G01 - MEASURING TESTING