Balamurugan Sankaranarayanan

Follow

Person

Kent, WA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Distributed analysis X-ray inspection methods and systems
- Patent number 12,174,334
- Issue date Dec 24, 2024
- Rapiscan Systems, Inc.
- Shehul Sailesh Parikh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Distributed analysis x-ray inspection methods and systems
- Patent number 11,099,294
- Issue date Aug 24, 2021
- Rapiscan Systems, Inc.
- Shehul Sailesh Parikh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Distributed analysis X-ray inspection methods and systems
- Patent number 10,830,920
- Issue date Nov 10, 2020
- Rapiscan Systems, Inc.
- Shehul Sailesh Parikh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Distributed analysis x-ray inspection methods and systems
- Patent number 10,509,142
- Issue date Dec 17, 2019
- Rapiscan Systems, Inc.
- Shehul Sailesh Parikh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray inspection system that integrates manifest data with imaging/...
- Patent number 10,422,919
- Issue date Sep 24, 2019
- Rapiscan Systems, Inc.
- Shehul Sailesh Parikh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray inspection system that integrates manifest data with imaging/...
- Patent number 9,111,331
- Issue date Aug 18, 2015
- Rapiscan Systems, Inc.
- Shehul Sailesh Parikh
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Distributed Analysis X-Ray Inspection Methods and Systems
- Publication number 20210405243
- Publication date Dec 30, 2021
- Rapiscan Systems, Inc.
- Shehul Sailesh Parikh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Distributed Analysis X-Ray Inspection Methods and Systems
- Publication number 20200073009
- Publication date Mar 5, 2020
- Rapiscan Systems, Inc.
- Shehul Sailesh Parikh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Distributed Analysis X-Ray Inspection Methods and Systems
- Publication number 20200073008
- Publication date Mar 5, 2020
- Rapiscan Systems, Inc.
- Shehul Sailesh Parikh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Distributed Analysis X-Ray Inspection Methods and Systems
- Publication number 20190162873
- Publication date May 30, 2019
- Rapiscan Systems, Inc.
- Shehul Sailesh Parikh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
X-RAY INSPECTION SYSTEM THAT INTEGRATES MANIFEST DATA WITH IMAGING/...
- Publication number 20130101172
- Publication date Apr 25, 2013
- Shehul Sailesh Parikh
- G01 - MEASURING TESTING