Balamurugan Subramanian

Person

Plano, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Die attach pick error detection
- Patent number 10,388,609
- Issue date Aug 20, 2019
- Texas Instruments Incorporated
- Dale Ohmart
- G01 - MEASURING TESTING
Information Patent Grant
Die attach pick error detection
- Patent number 9,229,058
- Issue date Jan 5, 2016
- Texas Instruments Incorporated
- Dale Ohmart
- G01 - MEASURING TESTING
Information Patent Grant
Method of arranging dies in a wafer for easy inkless partial wafer...
- Patent number 7,915,087
- Issue date Mar 29, 2011
- Texas Instruments Incorporated
- Balamurugan Subramanian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of arranging dies in a wafer for easy inkless partial wafer...
- Patent number 7,534,655
- Issue date May 19, 2009
- Texas Instruments Incorporated
- Balamurugan Subramanian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Partial wafer processing for random size wafers
- Patent number 7,015,068
- Issue date Mar 21, 2006
- Texas Instruments Incorporated
- Balamurugan Subramanian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of inkless wafer blind assembly
- Patent number 6,927,081
- Issue date Aug 9, 2005
- Texas Instruments Incorporated
- Balamurugan Subramanian
- G01 - MEASURING TESTING
Information Patent Grant
Method of identifying wafer cutting positions of different size par...
- Patent number 6,821,866
- Issue date Nov 23, 2004
- Texas Instruments Incorporated
- Balamurugan Subramanian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of search and identify reference die
- Patent number 6,756,796
- Issue date Jun 29, 2004
- Texas Instruments Incorporated
- Balamurugan Subramanian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automatic recovery for die bonder wafer table wafermap operations
- Patent number 6,380,000
- Issue date Apr 30, 2002
- Texas Instruments Incorporated
- Balamurugan Subramanian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for determining the center of a wafer on a wafer...
- Patent number 6,374,149
- Issue date Apr 16, 2002
- Texas Instruments Incorporated
- Balamurugan Subramanian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Partial semiconductor wafer processing with multiple cuts of random...
- Patent number 6,174,788
- Issue date Jan 16, 2001
- Texas Instruments Incorporated
- Subramanian Balamurugan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Partial semiconductor wafer processing using wafermap display
- Patent number 6,156,625
- Issue date Dec 5, 2000
- Texas Instruments Incorporated
- Subramanian Balamurugan
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
WAFER WITH DIE MAP
- Publication number 20160141251
- Publication date May 19, 2016
- TEXAS INSTRUMENTS INCORPORATED
- Dale Ohmart
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Die Attach Pick Error Detection
- Publication number 20140002128
- Publication date Jan 2, 2014
- Dale Ohmart
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor Wafer Adapted to Support Transparency in Partial Wafe...
- Publication number 20130214388
- Publication date Aug 22, 2013
- TEXAS INSTRUMENTS INCORPORATED
- Balamurugan Subramanian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of Arranging Dies in a Wafer for Easy Inkless Partial Wafer...
- Publication number 20090191689
- Publication date Jul 30, 2009
- TEXAS INSTRUMENTS INCORPORATED
- Balamurugan Subramanian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of arranging dies in a wafer for easy inkless partial wafer...
- Publication number 20080085588
- Publication date Apr 10, 2008
- TEXAS INSTRUMENTS INCORPORATED
- Balamurugan Subramanian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of inkless wafer blind assembly
- Publication number 20040215417
- Publication date Oct 28, 2004
- Balamurugan Subramanian
- G01 - MEASURING TESTING
Information Patent Application
Method of identifying wafer cutting positions of different size par...
- Publication number 20040180513
- Publication date Sep 16, 2004
- Balamurugan Subramanian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of search and identify reference die
- Publication number 20040029306
- Publication date Feb 12, 2004
- Balamurugan Subramanian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Partial wafer processing for random size wafers
- Publication number 20030224552
- Publication date Dec 4, 2003
- Balamurugan Subramanian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Wafer map host system
- Publication number 20030220706
- Publication date Nov 27, 2003
- Elmer M. Abenes
- G05 - CONTROLLING REGULATING

Balamurugan Subramanian

Person

Patents Grantslast 30 patents

Die attach pick error detection

Die attach pick error detection

Method of arranging dies in a wafer for easy inkless partial wafer...

Method of arranging dies in a wafer for easy inkless partial wafer...

Partial wafer processing for random size wafers

Method of inkless wafer blind assembly

Method of identifying wafer cutting positions of different size par...

Method of search and identify reference die

Automatic recovery for die bonder wafer table wafermap operations

System and method for determining the center of a wafer on a wafer...

Partial semiconductor wafer processing with multiple cuts of random...

Partial semiconductor wafer processing using wafermap display

Patents Applicationslast 30 patents

WAFER WITH DIE MAP

Die Attach Pick Error Detection

Semiconductor Wafer Adapted to Support Transparency in Partial Wafe...

Method of Arranging Dies in a Wafer for Easy Inkless Partial Wafer...

Method of arranging dies in a wafer for easy inkless partial wafer...

Method of inkless wafer blind assembly

Method of identifying wafer cutting positions of different size par...

Method of search and identify reference die

Partial wafer processing for random size wafers

Wafer map host system