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CUPERTINO, CA, US
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last 30 patents
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Patent Grant
Elapsed time indicator for controlled environments and method of use
Patent number
6,536,370
Issue date
Mar 25, 2003
Advanced Micro Devices, Inc.
Eric Paton
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
ELAPSED TIME INDICATOR FOR CONTROLLED ENVIRONMENTS AND METHOD OF USE
Publication number
20020000184
Publication date
Jan 3, 2002
ERIC PATON
G01 - MEASURING TESTING