Balkrishna S. Annigeri

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Manchester, CT, US

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Patents Grantslast 30 patents

Information Patent Grant
Structural integrity monitoring system including wireless electrome...
- Patent number 6,768,312
- Issue date Jul 27, 2004
- United Technologies Corporation
- Fanping Sun
- G01 - MEASURING TESTING
Information Patent Grant
Crack monitoring apparatus
- Patent number 5,673,203
- Issue date Sep 30, 1997
- United Technologies Corporation
- Balkrishna S. Annigeri
- G01 - MEASURING TESTING
Information Patent Grant
Crack monitoring apparatus
- Patent number 5,539,656
- Issue date Jul 23, 1996
- United Technologies Corporation
- Balkrishna S. Annigeri
- G01 - MEASURING TESTING
Information Patent Grant
High temperature crack monitoring apparatus
- Patent number 5,517,861
- Issue date May 21, 1996
- United Technologies Corporation
- Robert J. Haas
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Power harvesting sensor for monitoring and control
- Publication number 20040150529
- Publication date Aug 5, 2004
- Jeffrey T. Benoit
- G08 - SIGNALLING
Information Patent Application
Structural integrity monitoring system including wireless electrome...
- Publication number 20020190723
- Publication date Dec 19, 2002
- Fanping Sun
- G01 - MEASURING TESTING