Ballson Gopal

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Chandler, AZ, US

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Patents Grantslast 30 patents

Information Patent Grant
Test and burn-in apparatus that provides variable thermal resistance
- Patent number 11,768,224
- Issue date Sep 26, 2023
- Kes Systems, Inc.
- Ballson Gopal
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for conducting burn-in testing of semiconducto...
- Patent number 11,719,743
- Issue date Aug 8, 2023
- Kes Systems, Inc.
- Ballson Gopal
- G01 - MEASURING TESTING
Information Patent Grant
Burn-in test apparatus for semiconductor devices
- Patent number 11,061,069
- Issue date Jul 13, 2021
- Kes Systems, Inc.
- Ballson Gopal
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing semiconductor devices and an apparatus therefor
- Patent number 7,151,388
- Issue date Dec 19, 2006
- Kes Systems, Inc.
- Ballson Gopal
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEST AND BURN-IN APPARATUS THAT PROVIDES VARIABLE THERMAL RESISTANCE
- Publication number 20220082587
- Publication date Mar 17, 2022
- KES Systems, Inc.
- Ballson GOPAL
- G01 - MEASURING TESTING
Information Patent Application
BURN-IN TEST APPARATUS FOR SEMICONDUCTOR DEVICES
- Publication number 20210293877
- Publication date Sep 23, 2021
- KES Systems, Inc.
- Ballson GOPAL
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHODS FOR SEMICONDUCTOR BURN-IN TEST
- Publication number 20190204378
- Publication date Jul 4, 2019
- KES Systems, Inc.
- Ballson GOPAL
- G01 - MEASURING TESTING
Information Patent Application
Method for testing semiconductor devices and an apparatus therefor
- Publication number 20070040570
- Publication date Feb 22, 2007
- KES Systems, Inc.
- Ballson Gopal
- G01 - MEASURING TESTING
Information Patent Application
Method for testing semiconductor devices and an apparatus therefor
- Publication number 20070040569
- Publication date Feb 22, 2007
- KES Systems, Inc.
- Ballson Gopal
- G01 - MEASURING TESTING
Information Patent Application
Method for testing semiconductor devices and an apparatus therefor
- Publication number 20060066293
- Publication date Mar 30, 2006
- KES Systems, Inc.
- Ballson Gopal
- G01 - MEASURING TESTING