Banadappa V. Shivaray

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Yadgiri, IN

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Patents Grantslast 30 patents

Information Patent Grant
Clock generation for integrated circuit testing
- Patent number 10,234,505
- Issue date Mar 19, 2019
- Xilinx, Inc.
- Banadappa V. Shivaray
- G01 - MEASURING TESTING
Information Patent Grant
Non-destructive online testing for safety critical applications
- Patent number 10,169,177
- Issue date Jan 1, 2019
- Xilinx, Inc.
- Banadappa V Shivaray
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Input/output path testing and characterization using scan chains
- Patent number 10,067,189
- Issue date Sep 4, 2018
- Xilinx, Inc.
- Banadappa V. Shivaray
- G01 - MEASURING TESTING