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Bang-Thu Nguyen
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Santa Clara, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Method and apparatus for suppressing metal-gate cross-diffusion in...
Patent number
9,385,127
Issue date
Jul 5, 2016
Xilinx, Inc.
Qi Lin
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus and method for reducing plasma-induced damage in pMOSFETS
Patent number
8,890,164
Issue date
Nov 18, 2014
Xilinx, Inc.
Hong-Tsz Pan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Integrated circuit structure having a capacitor structured to reduc...
Patent number
8,878,337
Issue date
Nov 4, 2014
Xilinx, Inc.
Hong-Tsz Pan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Mitigation of well proximity effect in integrated circuits
Patent number
8,350,365
Issue date
Jan 8, 2013
Xilinx, Inc.
Yun Wu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Integrated circuit with stress inserts
Patent number
8,350,253
Issue date
Jan 8, 2013
Xilinx, Inc.
Bei Zhu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System and method for detecting mask data handling errors
Patent number
8,266,553
Issue date
Sep 11, 2012
Xilinx, Inc.
Bang-Thu Nguyen
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Apparatus and method for testing of stacked die structure
Patent number
8,063,654
Issue date
Nov 22, 2011
Xilinx, Inc.
Arifur Rahman
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for compensating an integrated circuit layout...
Patent number
7,673,270
Issue date
Mar 2, 2010
Xilinx, Inc.
Yan Wang
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Patents Applications
last 30 patents
Information
Patent Application
METHOD AND APPARATUS FOR SUPPRESSING METAL-GATE CROSS-DIFFUSION IN...
Publication number
20150054085
Publication date
Feb 26, 2015
Xilinx, Inc.
Qi Lin
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
APPARATUS AND METHOD FOR TESTING OF STACKED DIE STRUCTURE
Publication number
20110012633
Publication date
Jan 20, 2011
Xilinx, Inc.
Arifur Rahman
G01 - MEASURING TESTING