Baohua NIU

Person

Hsinchu, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for manufacturing semiconductor device
- Patent number 11,062,903
- Issue date Jul 13, 2021
- Taiwan Semiconductor Manufacturing Company Ltd.
- Neena Avinash Gilda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for metrology
- Patent number 10,883,820
- Issue date Jan 5, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Baohua Niu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for memory device testing and field applications
- Patent number 10,861,574
- Issue date Dec 8, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Baohua Niu
- G11 - INFORMATION STORAGE
Information Patent Grant
Electronic device including a capacitor
- Patent number 10,861,929
- Issue date Dec 8, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Kai-Fung Chang
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Method and apparatus for manufacturing semiconductor device
- Patent number 10,777,733
- Issue date Sep 15, 2020
- Taiwan Semiconductor Manufacturing Company Ltd.
- Neena Avinash Gilda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetic random access memory
- Patent number 10,727,401
- Issue date Jul 28, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Baohua Niu
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnetic detection circuit, MRAM and operation method thereof
- Patent number 10,672,832
- Issue date Jun 2, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Ji-Feng Ying
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for programming resistive memory cell with AC perturbation A...
- Patent number 10,510,410
- Issue date Dec 17, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd
- Ji-Feng Ying
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus for memory device testing and field applications
- Patent number 10,403,385
- Issue date Sep 3, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Baohua Niu
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for inspecting semiconductor device structure
- Patent number 10,345,373
- Issue date Jul 9, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd
- Baohua Niu
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR MEASURING MAGNETIC FIELD STRENGTH
- Publication number 20230358829
- Publication date Nov 9, 2023
- Taiwan Semiconductor Manufacturing company Ltd.
- Baohua NIU
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20200168789
- Publication date May 28, 2020
- Taiwan Semiconductor Manufacturing company Ltd.
- Neena Avinash GILDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20200135446
- Publication date Apr 30, 2020
- Taiwan Semiconductor Manufacturing company Ltd.
- Neena Avinash GILDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRONIC DEVICE INCLUDING A CAPACITOR
- Publication number 20200006470
- Publication date Jan 2, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Kai-Fung CHANG
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
APPARATUS FOR MEMORY DEVICE TESTING AND FIELD APPLICATIONS
- Publication number 20190385690
- Publication date Dec 19, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Baohua NIU
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD FOR PROGRAMMING RESISTIVE MEMORY CELL AND NONVOLATILE MEMORY...
- Publication number 20190147950
- Publication date May 16, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Ji-Feng Ying
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUS AND METHOD FOR METROLOGY
- Publication number 20190145756
- Publication date May 16, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Baohua NIU
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
MAGNETIC RANDOM ACCESS MEMORY
- Publication number 20190148628
- Publication date May 16, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Baohua NIU
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD AND APPARATUS FOR MEASURING MAGNETIC FIELD STRENGTH
- Publication number 20190146045
- Publication date May 16, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Baohua NIU
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC DETECTION CIRCUIT, MRAM AND OPERATION METHOD THEREOF
- Publication number 20190140020
- Publication date May 9, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Ji-Feng YING
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD FOR INSPECTING SEMICONDUCTOR DEVICE STRUCTURE
- Publication number 20190101586
- Publication date Apr 4, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Baohua NIU
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR MEMORY DEVICE TESTING AND FIELD APPLICATIONS
- Publication number 20190006022
- Publication date Jan 3, 2019
- Taiwan Semiconductor Manufacturing Co, LTD.
- Baohua NIU
- G11 - INFORMATION STORAGE

Person

Patents Grantslast 30 patents

Method and apparatus for manufacturing semiconductor device

Apparatus and method for metrology

Apparatus for memory device testing and field applications

Electronic device including a capacitor

Method and apparatus for manufacturing semiconductor device

Magnetic random access memory

Magnetic detection circuit, MRAM and operation method thereof

Method for programming resistive memory cell with AC perturbation A...

Apparatus for memory device testing and field applications

Method for inspecting semiconductor device structure

Patents Applicationslast 30 patents

METHOD AND APPARATUS FOR MEASURING MAGNETIC FIELD STRENGTH

METHOD AND APPARATUS FOR MANUFACTURING SEMICONDUCTOR DEVICE

METHOD AND APPARATUS FOR MANUFACTURING SEMICONDUCTOR DEVICE

ELECTRONIC DEVICE INCLUDING A CAPACITOR

APPARATUS FOR MEMORY DEVICE TESTING AND FIELD APPLICATIONS

METHOD FOR PROGRAMMING RESISTIVE MEMORY CELL AND NONVOLATILE MEMORY...

APPARATUS AND METHOD FOR METROLOGY

MAGNETIC RANDOM ACCESS MEMORY

METHOD AND APPARATUS FOR MEASURING MAGNETIC FIELD STRENGTH

MAGNETIC DETECTION CIRCUIT, MRAM AND OPERATION METHOD THEREOF

METHOD FOR INSPECTING SEMICONDUCTOR DEVICE STRUCTURE

APPARATUS FOR MEMORY DEVICE TESTING AND FIELD APPLICATIONS