Bappaditya Dey

Follow

Person

Heverlee, BE

People

Patents Grantslast 30 patents

Information Patent Grant
Method for de-noising an electron microscope image
- Patent number 12,243,193
- Issue date Mar 4, 2025
- Imec VZW
- Bappaditya Dey
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Reinforcement Learning (RL) Based Federated Automated Defect Classi...
- Publication number 20250076865
- Publication date Mar 6, 2025
- IMEC vzw
- Bappaditya Dey
- G05 - CONTROLLING REGULATING
Information Patent Application
Reinforcement Learning (RL) Based Federated Automated Defect Classi...
- Publication number 20250076866
- Publication date Mar 6, 2025
- IMEC vzw
- Bappaditya Dey
- G05 - CONTROLLING REGULATING
Information Patent Application
AUTOMATED DEFECT CLASSIFICATION AND DETECTION
- Publication number 20230343078
- Publication date Oct 26, 2023
- IMEC vzw
- Bappaditya Dey
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WAFER IMAGE DENOISING AND CONTOUR EXTRACTION FOR MANUFACTURING PROC...
- Publication number 20230342965
- Publication date Oct 26, 2023
- Siemens Industry Software Inc.
- Germain Louis Fenger
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR DE-NOISING AN ELECTRON MICROSCOPE IMAGE
- Publication number 20220076383
- Publication date Mar 10, 2022
- IMEC vzw
- Bappaditya Dey
- G06 - COMPUTING CALCULATING COUNTING