Bappaditya Dey

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Heverlee, BE

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Patents Applicationslast 30 patents

Information Patent Application
AUTOMATED DEFECT CLASSIFICATION AND DETECTION
- Publication number 20230343078
- Publication date Oct 26, 2023
- IMEC vzw
- Bappaditya Dey
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WAFER IMAGE DENOISING AND CONTOUR EXTRACTION FOR MANUFACTURING PROC...
- Publication number 20230342965
- Publication date Oct 26, 2023
- Siemens Industry Software Inc.
- Germain Louis Fenger
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR DE-NOISING AN ELECTRON MICROSCOPE IMAGE
- Publication number 20220076383
- Publication date Mar 10, 2022
- IMEC vzw
- Bappaditya Dey
- G06 - COMPUTING CALCULATING COUNTING