Barak DEE-NOOR

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Herzelia, IL

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Patents Grantslast 30 patents

Information Patent Grant
Temperature sensitive location error compensation
- Patent number 10,288,409
- Issue date May 14, 2019
- Applied Materials Israel Ltd.
- Yuval Gronau
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Imaging low electron yield regions with a charged beam imager
- Patent number 10,103,005
- Issue date Oct 16, 2018
- Applied Materials Israel Ltd.
- Yuval Gronau
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for setting a temperature of an object within a c...
- Patent number 10,074,512
- Issue date Sep 11, 2018
- Applied Materials Israel Ltd.
- Chun-Hsiang Yen
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
IMAGING LOW ELECTRON YIELD REGIONS WITH A CHARGED BEAM IMAGER
- Publication number 20170011881
- Publication date Jan 12, 2017
- APPLIED MATERIALS ISRAEL LTD.
- Yuval GRONAU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR SETTING A TEMPERATURE OF AN OBJECT WITHIN A C...
- Publication number 20170011882
- Publication date Jan 12, 2017
- APPLIED MATERIALS ISRAEL, LTD.
- Chun-Hsiang Yen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEMPERATURE SENSITIVE LOCATION ERROR COMPENSATION
- Publication number 20160290786
- Publication date Oct 6, 2016
- APPLIED MATERIALS ISRAEL LTD.
- Yuval GRONAU
- G01 - MEASURING TESTING