Barbara Fong Chin LIM

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Singapore, SG

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Patents Grantslast 30 patents

Information Patent Grant
Defect monitoring in semiconductor device fabrication
- Patent number 8,339,449
- Issue date Dec 25, 2012
- GLOBALFOUNDRIES Singapore Pte. Ltd.
- Barbara Fong Chin Lim
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEFECT MONITORING IN SEMICONDUCTOR DEVICE FABRICATION
- Publication number 20110032348
- Publication date Feb 10, 2011
- CHARTERED SEMICONDUCTOR MANUFACTURING, LTD.
- Barbara Fong Chin LIM
- G06 - COMPUTING CALCULATING COUNTING