Barney Drake

Person

Santa Barbara, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Neural circuit probe
- Patent number 10,488,391
- Issue date Nov 26, 2019
- The Regents of the University of California
- Paul K. Hansma
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Scanning stylus atomic force microscope with cantilever tracking an...
- Patent number 8,087,288
- Issue date Jan 3, 2012
- Bruker Nano, Inc.
- Craig B. Prater
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Methods and instruments for materials testing
- Patent number 7,966,866
- Issue date Jun 28, 2011
- The Regents of the University of California
- Paul Hansma
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Measurement head for atomic force microscopy and other applications
- Patent number 6,871,527
- Issue date Mar 29, 2005
- The Regents of the University of California
- Paul K. Hansma
- G01 - MEASURING TESTING
Information Patent Grant
Scanning stylus atomic force microscope with cantilever tracking an...
- Patent number 6,032,518
- Issue date Mar 7, 2000
- Digital Instruments, Inc.
- Craig B. Prater
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning stylus atomic force microscope with cantilever tracking an...
- Patent number 5,714,682
- Issue date Feb 3, 1998
- Digital Instruments, Inc.
- Craig B. Prater
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning stylus atomic force microscope with cantilever tracking an...
- Patent number 5,560,244
- Issue date Oct 1, 1996
- Digital Instruments, Inc.
- Craig B. Prater
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning stylus atomic force microscope with cantilever tracking an...
- Patent number 5,463,897
- Issue date Nov 7, 1995
- Digital Instruments, Inc.
- Craig B. Prater
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning ion conductance microscope
- Patent number RE34708
- Issue date Aug 30, 1994
- The Regents of the University of California
- Paul K. Hansma
- 250 - Radiant energy
Information Patent Grant
Atomic force microscope with optional replaceable fluid cell
- Patent number RE34489
- Issue date Dec 28, 1993
- The Regents of the University of California
- Paul K. Hansma
- 250 - Radiant energy
Information Patent Grant
Atomic force microscope with optional replaceable fluid cell
- Patent number 4,935,634
- Issue date Jun 19, 1990
- The Regents of the University of California
- Paul K. Hansma
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning ion conductance microscope
- Patent number 4,924,091
- Issue date May 8, 1990
- The Regents of the University of California
- Paul K. Hansma
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
NEURAL CIRCUIT PROBE
- Publication number 20170241976
- Publication date Aug 24, 2017
- The Regents of the University of California
- Paul K. Hansma
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND INSTRUMENTS FOR MATERIAL TESTING
- Publication number 20110303022
- Publication date Dec 15, 2011
- The Regents of the University of California
- Paul Hansma
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Methods and instruments for materials testing
- Publication number 20090056427
- Publication date Mar 5, 2009
- Paul Hansma
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Measurement head for atomic force microscopy and other applications
- Publication number 20030015653
- Publication date Jan 23, 2003
- Paul K. Hansma
- G01 - MEASURING TESTING

Barney Drake

Person

Patents Grantslast 30 patents

Neural circuit probe

Scanning stylus atomic force microscope with cantilever tracking an...

Methods and instruments for materials testing

Measurement head for atomic force microscopy and other applications

Scanning stylus atomic force microscope with cantilever tracking an...

Scanning stylus atomic force microscope with cantilever tracking an...

Scanning stylus atomic force microscope with cantilever tracking an...

Scanning stylus atomic force microscope with cantilever tracking an...

Scanning ion conductance microscope

Atomic force microscope with optional replaceable fluid cell

Atomic force microscope with optional replaceable fluid cell

Scanning ion conductance microscope

Patents Applicationslast 30 patents

NEURAL CIRCUIT PROBE

METHODS AND INSTRUMENTS FOR MATERIAL TESTING

Methods and instruments for materials testing

Measurement head for atomic force microscopy and other applications