Barry Becker

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Computer-implemented methods, carrier media, and systems for creati...
- Patent number 8,135,204
- Issue date Mar 13, 2012
- KLA-Tencor Technologies Corp.
- Chien-Huei (Adam) Chen
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for generating information to be used for selec...
- Patent number 8,000,922
- Issue date Aug 16, 2011
- KLA-Tencor Corp.
- Hong Chen
- G01 - MEASURING TESTING
Information Patent Grant
Electron beam inspection system and method
- Patent number 5,502,306
- Issue date Mar 26, 1996
- KLA Instruments Corporation
- Dan Meisburger
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHODS AND SYSTEMS FOR GENERATING INFORMATION TO BE USED FOR SELEC...
- Publication number 20090299681
- Publication date Dec 3, 2009
- Hong Chen
- G01 - MEASURING TESTING