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Barry Eppler
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Loveland, CO, US
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Patents Grants
last 30 patents
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Patent Grant
X-ray laminography system having a pitch, roll and Z-motion positio...
Patent number
6,977,985
Issue date
Dec 20, 2005
Agilent Technologies, Inc.
David D Bohn
G01 - MEASURING TESTING
Information
Patent Grant
Nonplanar x-ray target anode for use in a laminography imaging system
Patent number
6,965,662
Issue date
Nov 15, 2005
Agilent Technologies, Inc.
Barry Eppler
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for calibrating an x-ray laminography imaging...
Patent number
6,819,739
Issue date
Nov 16, 2004
Agilent Technologies, Inc.
Barry Eppler
G01 - MEASURING TESTING
Information
Patent Grant
Image-based inspection system including positioning compensation fo...
Patent number
6,628,746
Issue date
Sep 30, 2003
Agilent Technologies, Inc.
Barry Eppler
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Nonplanar x-ray target anode for use in a laminography imaging system
Publication number
20040114712
Publication date
Jun 17, 2004
Barry Eppler
G01 - MEASURING TESTING
Information
Patent Application
X-ray laminography system having a pitch, roll and Z-motion positio...
Publication number
20040114713
Publication date
Jun 17, 2004
David D. Bohn
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for calibrating an x-ray laminography imaging...
Publication number
20040101110
Publication date
May 27, 2004
Barry Eppler
G01 - MEASURING TESTING
Information
Patent Application
Image-based inspection system including positioning compensation fo...
Publication number
20030081717
Publication date
May 1, 2003
Barry Eppler
G01 - MEASURING TESTING