Barry J. Blasenheim

Person

San Carlos, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Measurement and control of wafer tilt for x-ray based metrology
- Patent number 11,513,085
- Issue date Nov 29, 2022
- KLA Corporation
- Barry Blasenheim
- G01 - MEASURING TESTING
Information Patent Grant
Variable aperture mask
- Patent number 11,268,901
- Issue date Mar 8, 2022
- KLA Corporation
- Barry Blasenheim
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor metrology based on hyperspectral imaging
- Patent number 10,801,953
- Issue date Oct 13, 2020
- KLA-Tencor Corporation
- David Y. Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Lens design for spectroscopic ellipsometer or reflectometer
- Patent number 10,739,571
- Issue date Aug 11, 2020
- KLA-Tencor Corporation
- Barry Blasenheim
- G01 - MEASURING TESTING
Information Patent Grant
Variable aperture mask
- Patent number 10,663,392
- Issue date May 26, 2020
- KLA Corporation
- Barry Blasenheim
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for metrology beam stabilization
- Patent number 10,365,211
- Issue date Jul 30, 2019
- KLA-Tencor Corporation
- Barry Blasenheim
- G02 - OPTICS
Information Patent Grant
Ellipsometer focusing system
- Patent number 9,243,999
- Issue date Jan 26, 2016
- Nanometrics Incorporated
- Barry J. Blasenheim
- G01 - MEASURING TESTING
Information Patent Grant
Optical camera alignment
- Patent number 8,638,509
- Issue date Jan 28, 2014
- Applied Biosystems, LLC.
- Barry Blasenheim
- G01 - MEASURING TESTING
Information Patent Grant
Ellipsometer focusing system
- Patent number 8,559,008
- Issue date Oct 15, 2013
- Nanometrics Incorporated
- Barry J. Blasenheim
- G01 - MEASURING TESTING
Information Patent Grant
Optical camera alignment
- Patent number 8,040,619
- Issue date Oct 18, 2011
- Applied Biosystems, LLC.
- Barry J. Blasenheim
- G01 - MEASURING TESTING
Information Patent Grant
Optical camera alignment
- Patent number 7,570,443
- Issue date Aug 4, 2009
- Applied Biosystems, LLC.
- Barry J. Blasenheim
- G01 - MEASURING TESTING
Information Patent Grant
Fluorescence detection instrument with reflective transfer legs for...
- Patent number 7,129,505
- Issue date Oct 31, 2006
- Becton Dickinson and Company
- Clifford A. Oostman, Jr.
- G01 - MEASURING TESTING
Information Patent Grant
Fluorescence detection instrument with reflective transfer legs for...
- Patent number 6,683,314
- Issue date Jan 27, 2004
- Becton, Dickinson and Company
- Clifford A. Oostman
- G01 - MEASURING TESTING
Information Patent Grant
Flow cytometry lens system
- Patent number 6,510,007
- Issue date Jan 21, 2003
- Becton Dickinson and Company
- Barry J. Blasenheim
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Measurement And Control Of Wafer Tilt For X-Ray Based Metrology
- Publication number 20210262950
- Publication date Aug 26, 2021
- KLA Corporation
- Barry Blasenheim
- G01 - MEASURING TESTING
Information Patent Application
MAGNETO-OPTIC KERR EFFECT METROLOGY SYSTEMS
- Publication number 20200302965
- Publication date Sep 24, 2020
- KLA Corporation
- Jun Wang
- G11 - INFORMATION STORAGE
Information Patent Application
Variable Aperture Mask
- Publication number 20200271569
- Publication date Aug 27, 2020
- KLA Corporation
- Barry Blasenheim
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor Metrology Based On Hyperspectral Imaging
- Publication number 20200225151
- Publication date Jul 16, 2020
- KLA-Tencor Corporation
- David Y. Wang
- G01 - MEASURING TESTING
Information Patent Application
LENS DESIGN FOR SPECTROSCOPIC ELLIPSOMETER OR REFLECTOMETER
- Publication number 20190107697
- Publication date Apr 11, 2019
- KLA-Tencor Corporation
- Barry Blasenheim
- G01 - MEASURING TESTING
Information Patent Application
Systems And Methods For Metrology Beam Stabilization
- Publication number 20190094130
- Publication date Mar 28, 2019
- KLA-Tencor Corporation
- Barry Blasenheim
- G01 - MEASURING TESTING
Information Patent Application
Variable Aperture Mask
- Publication number 20190049365
- Publication date Feb 14, 2019
- KLA-Tencor Corporation
- Barry Blasenheim
- G02 - OPTICS
Information Patent Application
INSPECTION SYSTEM AND METHOD USING AN OFF-AXIS UNOBSCURED OBJECTIVE...
- Publication number 20160139032
- Publication date May 19, 2016
- KLA-Tencor Corporation
- Claudio Rampoldi
- G01 - MEASURING TESTING
Information Patent Application
ELLIPSOMETER FOCUSING SYSTEM
- Publication number 20140098369
- Publication date Apr 10, 2014
- Nanometrics Incorporated
- Barry J. Blasenheim
- G02 - OPTICS
Information Patent Application
Ellipsometer Focusing System
- Publication number 20120257200
- Publication date Oct 11, 2012
- Nanometrics Incorporated
- Barry J. Blasenheim
- G02 - OPTICS
Information Patent Application
OPTICAL CAMERA ALIGNMENT
- Publication number 20120080610
- Publication date Apr 5, 2012
- Life Technologies Corporation
- Barry J. Blasenheim
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Optical Camera Alignment
- Publication number 20100193672
- Publication date Aug 5, 2010
- Life Technologies Corporation
- Barry J. Blasenheim
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
FLUORESCENCE DETECTION INSTRUMENT WITH REFLECTIVE TRANSFER LEGS FOR...
- Publication number 20060197032
- Publication date Sep 7, 2006
- Clifford A. Oostman
- G01 - MEASURING TESTING
Information Patent Application
Optical camera alignment
- Publication number 20050231723
- Publication date Oct 20, 2005
- Barry J. Blasenheim
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Fluorescence detection instrument with reflective transfer legs for...
- Publication number 20050104008
- Publication date May 19, 2005
- Clifford A. Oostman
- G01 - MEASURING TESTING
Information Patent Application
Prism-based flow cytometry excitation optics
- Publication number 20040061853
- Publication date Apr 1, 2004
- Barry J. Blasenheim
- G01 - MEASURING TESTING
Information Patent Application
Fluorescence detection instrument with reflective transfer legs for...
- Publication number 20030048539
- Publication date Mar 13, 2003
- Clifford A. Oostman
- G01 - MEASURING TESTING

Barry J. Blasenheim

Person

Patents Grantslast 30 patents

Measurement and control of wafer tilt for x-ray based metrology

Variable aperture mask

Semiconductor metrology based on hyperspectral imaging

Lens design for spectroscopic ellipsometer or reflectometer

Variable aperture mask

Systems and methods for metrology beam stabilization

Ellipsometer focusing system

Optical camera alignment

Ellipsometer focusing system

Optical camera alignment

Optical camera alignment

Fluorescence detection instrument with reflective transfer legs for...

Fluorescence detection instrument with reflective transfer legs for...

Flow cytometry lens system

Patents Applicationslast 30 patents

Measurement And Control Of Wafer Tilt For X-Ray Based Metrology

MAGNETO-OPTIC KERR EFFECT METROLOGY SYSTEMS

Variable Aperture Mask

Semiconductor Metrology Based On Hyperspectral Imaging

LENS DESIGN FOR SPECTROSCOPIC ELLIPSOMETER OR REFLECTOMETER

Systems And Methods For Metrology Beam Stabilization

Variable Aperture Mask

INSPECTION SYSTEM AND METHOD USING AN OFF-AXIS UNOBSCURED OBJECTIVE...

ELLIPSOMETER FOCUSING SYSTEM

Ellipsometer Focusing System

OPTICAL CAMERA ALIGNMENT

Optical Camera Alignment

FLUORESCENCE DETECTION INSTRUMENT WITH REFLECTIVE TRANSFER LEGS FOR...

Optical camera alignment

Fluorescence detection instrument with reflective transfer legs for...

Prism-based flow cytometry excitation optics

Fluorescence detection instrument with reflective transfer legs for...