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Barry L. Rosenow
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Beaverton, OR, US
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last 30 patents
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Patent Grant
Method of detecting and characterizing anomalies in a propagative m...
Patent number
5,155,439
Issue date
Oct 13, 1992
Tektronix, Inc.
Dennis L. Holmbo
G01 - MEASURING TESTING
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Patent Grant
High resolution optical fault locator
Patent number
5,008,545
Issue date
Apr 16, 1991
Tektronix, Inc.
Duwayne R. Anderson
G01 - MEASURING TESTING
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Patent Grant
Method of displaying acquired data
Patent number
4,996,654
Issue date
Feb 26, 1991
Tektronix, Inc.
Barry L. Rosenow
G01 - MEASURING TESTING