Barry Loevsky

Person

Yokneam Illit, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Pupil tracking in an image display system
- Patent number 11,663,937
- Issue date May 30, 2023
- Real View Imaging Ltd.
- Barry Loevsky
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Zero order blocking and diverging for holographic imaging
- Patent number 10,877,437
- Issue date Dec 29, 2020
- Real View Imaging Ltd.
- Shaul Alexander Gelman
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Polarization measurements of metrology targets and corresponding ta...
- Patent number 10,458,777
- Issue date Oct 29, 2019
- KLA-Tencor Corporation
- Eran Amit
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Focusing modules and methods
- Patent number 10,352,766
- Issue date Jul 16, 2019
- KLA-Tencor Corporation
- Barry Loevsky
- G01 - MEASURING TESTING
Information Patent Grant
Scatterometry system and method for generating non-overlapping and...
- Patent number 10,209,183
- Issue date Feb 19, 2019
- KLA-Tencor Corporation
- Tzahi Grunzweig
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Metrology imaging targets having reflection-symmetric pairs of refl...
- Patent number 10,190,979
- Issue date Jan 29, 2019
- KLA-Tencor Corporation
- Amnon Manassen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scatterometry system and method for generating non-overlapping and...
- Patent number 9,719,920
- Issue date Aug 1, 2017
- KLA-Tencor Corporation
- Tzahi Grunzweig
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Detectable overlay targets with strong definition of center locations
- Patent number 9,429,856
- Issue date Aug 30, 2016
- KLA-Tencor Corporation
- Amnon Manassen
- G01 - MEASURING TESTING
Information Patent Grant
Measurement of critical dimension and scanner aberration utilizing...
- Patent number 9,255,787
- Issue date Feb 9, 2016
- KLA-Tencor Corporation
- Amnon Manassen
- G01 - MEASURING TESTING
Information Patent Grant
Overlay measurement based on moire effect between structured illumi...
- Patent number 9,182,219
- Issue date Nov 10, 2015
- KLA-Tencor Corporation
- Amnon Manassen
- G01 - MEASURING TESTING
Information Patent Grant
Fit-to-pitch overlay measurement targets
- Patent number 9,123,649
- Issue date Sep 1, 2015
- KLA-Tencor Corporation
- Amnon Manassen
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
PUPIL TRACKING IN AN IMAGE DISPLAY SYSTEM
- Publication number 20200184865
- Publication date Jun 11, 2020
- Real View Imaging Ltd.
- Barry LOEVSKY
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
ZERO ORDER BLOCKING AND DIVERGING FOR HOLOGRAPHIC IMAGING
- Publication number 20190004478
- Publication date Jan 3, 2019
- Real View Imaging Ltd.
- Shaul Alexander GELMAN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Scatterometry System and Method for Generating Non-Overlapping and...
- Publication number 20180003630
- Publication date Jan 4, 2018
- KLA-Tencor Corporation
- Tzahi Grunzweig
- G01 - MEASURING TESTING
Information Patent Application
POLARIZATION MEASUREMENTS OF METROLOGY TARGETS AND CORRESPONDING TA...
- Publication number 20160178351
- Publication date Jun 23, 2016
- KLA-Tencor Corporation
- Eran AMIT
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY IMAGING TARGETS HAVING REFLECTION-SYMMETRIC PAIRS OF REFL...
- Publication number 20160084758
- Publication date Mar 24, 2016
- KLA-Tencor Corporation
- Amnon Manassen
- G01 - MEASURING TESTING
Information Patent Application
ILLUMINATION CONFIGURATIONS FOR SCATTEROMETRY MEASUREMENTS
- Publication number 20150022822
- Publication date Jan 22, 2015
- KLA-Tencor Corporation
- Tzahi Grunzweig
- G01 - MEASURING TESTING

Barry Loevsky

Person

Patents Grantslast 30 patents

Pupil tracking in an image display system

Zero order blocking and diverging for holographic imaging

Polarization measurements of metrology targets and corresponding ta...

Focusing modules and methods

Scatterometry system and method for generating non-overlapping and...

Metrology imaging targets having reflection-symmetric pairs of refl...

Scatterometry system and method for generating non-overlapping and...

Detectable overlay targets with strong definition of center locations

Measurement of critical dimension and scanner aberration utilizing...

Overlay measurement based on moire effect between structured illumi...

Fit-to-pitch overlay measurement targets

Patents Applicationslast 30 patents

PUPIL TRACKING IN AN IMAGE DISPLAY SYSTEM

ZERO ORDER BLOCKING AND DIVERGING FOR HOLOGRAPHIC IMAGING

Scatterometry System and Method for Generating Non-Overlapping and...

POLARIZATION MEASUREMENTS OF METROLOGY TARGETS AND CORRESPONDING TA...

METROLOGY IMAGING TARGETS HAVING REFLECTION-SYMMETRIC PAIRS OF REFL...

ILLUMINATION CONFIGURATIONS FOR SCATTEROMETRY MEASUREMENTS