Barry M. Wise

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Manson, WA, US

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Patents Grantslast 30 patents

Information Patent Grant
System and method for determining endpoint in etch processes using...
- Patent number 6,830,939
- Issue date Dec 14, 2004
- Verity Instruments, Inc.
- Kenneth C. Harvey
- G01 - MEASURING TESTING
Information Patent Grant
Methods for characterizing, classifying, and identifying unknowns i...
- Patent number 6,606,567
- Issue date Aug 12, 2003
- Battelle Memorial Institute
- Jay W. Grate
- G01 - MEASURING TESTING
Information Patent Grant
Methods for characterizing, classifying, and identifying unknowns i...
- Patent number 6,408,250
- Issue date Jun 18, 2002
- Battelle Memorial Institute
- Jay W. Grate
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
System and method for determining endpoint in etch processes using...
- Publication number 20040045934
- Publication date Mar 11, 2004
- Kenneth C. Harvey
- G01 - MEASURING TESTING
Information Patent Application
Methods for characterizing, classifying, and identifying unknowns i...
- Publication number 20010029774
- Publication date Oct 18, 2001
- Jay W. Grate
- B82 - NANO-TECHNOLOGY