Barry P. Linder

Person

Hastings-on-Hudson, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Gate stacks with multiple high-κ dielectric layers
- Patent number 11,961,895
- Issue date Apr 16, 2024
- International Business Machines Corporation
- Ruqiang Bao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
RRAM structures in the BEOL
- Patent number 11,877,458
- Issue date Jan 16, 2024
- International Business Machines Corporation
- Baozhen Li
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Fabrication of phase change memory cell in integrated circuit
- Patent number 11,647,681
- Issue date May 9, 2023
- International Business Machines Corporation
- Baozhen Li
Information Patent Grant
Switchable metal insulator metal capacitor
- Patent number 11,276,748
- Issue date Mar 15, 2022
- International Business Machines Corporation
- Baozhen Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detection of performance degradation in integrated circuits
- Patent number 11,105,856
- Issue date Aug 31, 2021
- International Business Machines Corporation
- Emily A. Ray
- G01 - MEASURING TESTING
Information Patent Grant
Measuring individual device degradation in CMOS circuits
- Patent number 10,901,025
- Issue date Jan 26, 2021
- International Business Machines Corporation
- Barry P. Linder
- G01 - MEASURING TESTING
Information Patent Grant
Fabrication of phase change memory cell in integrated circuit
- Patent number 10,840,447
- Issue date Nov 17, 2020
- International Business Machines Corporation
- Baozhen Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
BTI degradation test circuit
- Patent number 10,782,336
- Issue date Sep 22, 2020
- International Business Machines Corporation
- Keith A. Jenkins
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic predictor of semiconductor lifetime limits
- Patent number 10,746,785
- Issue date Aug 18, 2020
- International Business Machines Corporation
- Chen-Yong Cher
- G01 - MEASURING TESTING
Information Patent Grant
Analytics to determine customer satisfaction
- Patent number 10,671,958
- Issue date Jun 2, 2020
- International Business Machines Corporation
- Karthik Balakrishnan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Reduction of negative bias temperature instability
- Patent number 10,622,355
- Issue date Apr 14, 2020
- International Business Machines Corporation
- Takashi Ando
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reducing dark current in germanium photodiodes by electrical over-s...
- Patent number 10,608,138
- Issue date Mar 31, 2020
- International Business Machines Corporation
- Barry P. Linder
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Non-destructive analysis to determine use history of processor
- Patent number 10,552,278
- Issue date Feb 4, 2020
- International Business Machines Corporation
- Keith A. Jenkins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Touch movement activation for gaining access beyond a restricted ac...
- Patent number 10,433,173
- Issue date Oct 1, 2019
- International Business Machines Corporation
- Keith A. Jenkins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
On-chip combined hot carrier injection and bias temperature instabi...
- Patent number 10,388,580
- Issue date Aug 20, 2019
- International Business Machines Corporation
- Keith A. Jenkins
- G01 - MEASURING TESTING
Information Patent Grant
Autonomic supply voltage compensation for degradation of circuits o...
- Patent number 10,365,702
- Issue date Jul 30, 2019
- International Business Machines Corporation
- Chen-Yong Cher
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Analytics to determine customer satisfaction
- Patent number 10,360,526
- Issue date Jul 23, 2019
- International Business Machines Corporation
- Karthik Balakrishnan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Three plate MIM capacitor via integrity verification
- Patent number 10,262,934
- Issue date Apr 16, 2019
- International Business Machines Corporation
- Andrew T. Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reducing dark current in germanium photodiodes by electrical over-s...
- Patent number 10,249,785
- Issue date Apr 2, 2019
- International Business Machines Corporation
- Barry P. Linder
- G01 - MEASURING TESTING
Information Patent Grant
Measuring individual device degradation in CMOS circuits
- Patent number 10,247,769
- Issue date Apr 2, 2019
- International Business Machines Corporation
- Barry P. Linder
- G01 - MEASURING TESTING
Information Patent Grant
Reducing dark current in germanium photodiodes by electrical over-s...
- Patent number 10,236,407
- Issue date Mar 19, 2019
- International Business Machines Corporation
- Barry P. Linder
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Three plate MIM capacitor via integrity verification
- Patent number 10,229,873
- Issue date Mar 12, 2019
- International Business Machines Corporation
- Andrew T. Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reduction of negative bias temperature instability
- Patent number 10,192,869
- Issue date Jan 29, 2019
- International Business Machines Corporation
- Takashi Ando
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reduction of negative bias temperature instability
- Patent number 10,134,732
- Issue date Nov 20, 2018
- International Business Machines Corporation
- Takashi Ando
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test structures for dielectric reliability evaluations
- Patent number 10,103,060
- Issue date Oct 16, 2018
- GLOBALFOUNDRIES Inc.
- David G. Brochu
- G01 - MEASURING TESTING
Information Patent Grant
Non-destructive analysis to determine use history of processor
- Patent number 10,102,090
- Issue date Oct 16, 2018
- International Business Machines Corporation
- Keith A. Jenkins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Reducing dark current in germanium photodiodes by electrical over-s...
- Patent number 10,043,938
- Issue date Aug 7, 2018
- International Business Machines Corporation
- Barry P. Linder
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
On-chip combined hot carrier injection and bias temperature instabi...
- Patent number 10,002,810
- Issue date Jun 19, 2018
- International Business Machines Corporation
- Keith A. Jenkins
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measurement for transistor output characteristics with and without...
- Patent number 9,952,274
- Issue date Apr 24, 2018
- International Business Machines Corporation
- Keith A. Jenkins
- G01 - MEASURING TESTING
Information Patent Grant
Selective thickening of pFET dielectric
- Patent number 9,941,371
- Issue date Apr 10, 2018
- International Business Machines Corporation
- Takashi Ando
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
TIME DEPENDENT DIELECTRIC BREAKDOWN RELIABILITY TESTING OF A SRAM
- Publication number 20240203519
- Publication date Jun 20, 2024
- International Business Machines Corporation
- Giuseppe La Rosa
- G11 - INFORMATION STORAGE
Information Patent Application
INNER SPACER RELIABILITY MACRO DESIGN AND WELL CONTACT FORMATION
- Publication number 20240113200
- Publication date Apr 4, 2024
- International Business Machines Corporation
- HUIMEI ZHOU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRUCTURE TO FORM AND INTEGRATE HIGH VOLTAGE FINFET I/O DEVICE WITH...
- Publication number 20240105769
- Publication date Mar 28, 2024
- International Business Machines Corporation
- Shahab Siddiqui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GATE STACKS WITH MULTIPLE HIGH-K DIELECTRIC LAYERS
- Publication number 20230075740
- Publication date Mar 9, 2023
- International Business Machines Corporation
- Ruqiang Bao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RRAM STRUCTURES IN THE BEOL
- Publication number 20210280638
- Publication date Sep 9, 2021
- International Business Machines Corporation
- Baozhen Li
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SWITCHABLE METAL INSULATOR METAL CAPACITOR
- Publication number 20210036096
- Publication date Feb 4, 2021
- International Business Machines Corporation
- Baozhen Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FABRICATION OF PHASE CHANGE MEMORY CELL IN INTEGRATED CIRCUIT
- Publication number 20210020836
- Publication date Jan 21, 2021
- International Business Machines Corporation
- Baozhen Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FABRICATION OF PHASE CHANGE MEMORY CELL IN INTEGRATED CIRCUIT
- Publication number 20200295261
- Publication date Sep 17, 2020
- International Business Machines Corporation
- Baozhen Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ENERGY STORAGE COMPONENT DELIVERY SYSTEM
- Publication number 20200231278
- Publication date Jul 23, 2020
- International Business Machines Corporation
- Rasit Onur Topaloglu
- B60 - VEHICLES IN GENERAL
Information Patent Application
DETECTION OF PERFORMANCE DEGRADATION IN INTEGRATED CIRCUITS
- Publication number 20200150181
- Publication date May 14, 2020
- International Business Machines Corporation
- Emily A. Ray
- G01 - MEASURING TESTING
Information Patent Application
ANALYTICS TO DETERMINE CUSTOMER SATISFACTION
- Publication number 20190266538
- Publication date Aug 29, 2019
- International Business Machines Corporation
- Karthik Balakrishnan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
REDUCTION OF NEGATIVE BIAS TEMPERATURE INSTABILITY
- Publication number 20190013315
- Publication date Jan 10, 2019
- International Business Machines Corporation
- Takashi Ando
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEASURING INDIVIDUAL DEVICE DEGRADATION IN CMOS CIRCUITS
- Publication number 20180364296
- Publication date Dec 20, 2018
- International Business Machines Corporation
- Barry P. Linder
- G01 - MEASURING TESTING
Information Patent Application
NON-DESTRUCTIVE ANALYSIS TO DETERMINE USE HISTORY OF PROCESSOR
- Publication number 20180322025
- Publication date Nov 8, 2018
- International Business Machines Corporation
- Keith A. Jenkins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Autonomic Supply Voltage Compensation for Degradation of Circuits o...
- Publication number 20180292879
- Publication date Oct 11, 2018
- International Business Machines Corporation
- Chen-Yong Cher
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
REDUCING DARK CURRENT IN GERMANIUM PHOTODIODES BY ELECTRICAL OVER-S...
- Publication number 20180277709
- Publication date Sep 27, 2018
- International Business Machines Corporation
- Barry P. Linder
- G01 - MEASURING TESTING
Information Patent Application
THREE PLATE MIM CAPACITOR VIA INTEGRITY VERIFICATION
- Publication number 20180226339
- Publication date Aug 9, 2018
- International Business Machines Corporation
- Andrew T. Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THREE PLATE MIM CAPACITOR VIA INTEGRITY VERIFICATION
- Publication number 20180226338
- Publication date Aug 9, 2018
- International Business Machines Corporation
- Andrew T. Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ON-CHIP COMBINED HOT CARRIER INJECTION AND BIAS TEMPERATURE INSTABI...
- Publication number 20180211894
- Publication date Jul 26, 2018
- International Business Machines Corporation
- Keith A. Jenkins
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
REDUCING DARK CURRENT IN GERMANIUM PHOTODIODES BY ELECTRICAL OVER-S...
- Publication number 20180053875
- Publication date Feb 22, 2018
- International Business Machines Corporation
- Barry P. Linder
- G01 - MEASURING TESTING
Information Patent Application
DYNAMIC PREDICTOR OF SEMICONDUCTOR LIFETIME LIMITS
- Publication number 20180038906
- Publication date Feb 8, 2018
- International Business Machines Corporation
- Chen-Yong Cher
- G01 - MEASURING TESTING
Information Patent Application
TOUCH MOVEMENT ACTIVATION FOR GAINING ACCESS BEYOND A RESTRICTED AC...
- Publication number 20180035298
- Publication date Feb 1, 2018
- International Business Machines Corporation
- Keith A. Jenkins
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
ANALYTICS TO DETERMINE CUSTOMER SATISFACTION
- Publication number 20180032939
- Publication date Feb 1, 2018
- International Business Machines Corporation
- Karthik Balakrishnan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
REDUCING DARK CURRENT IN GERMANIUM PHOTODIODES BY ELECTRICAL OVER-S...
- Publication number 20170365735
- Publication date Dec 21, 2017
- International Business Machines Corporation
- Barry P. Linder
- G01 - MEASURING TESTING
Information Patent Application
TEST CIRCUIT TO ISOLATE HCI DEGRADATION
- Publication number 20170346492
- Publication date Nov 30, 2017
- International Business Machines Corporation
- Keith A. Jenkins
- G01 - MEASURING TESTING
Information Patent Application
NON-DESTRUCTIVE ANALYSIS TO DETERMINE USE HISTORY OF PROCESSOR
- Publication number 20170329685
- Publication date Nov 16, 2017
- International Business Machines Corporation
- Keith A. Jenkins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TOUCH MOVEMENT ACTIVATION FOR GAINING ACCESS BEYOND A RESTRICTED AC...
- Publication number 20170325093
- Publication date Nov 9, 2017
- International Business Machines Corporation
- Keith A. Jenkins
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
BTI DEGRADATION TEST CIRCUIT
- Publication number 20170276728
- Publication date Sep 28, 2017
- International Business Machines Corporation
- Keith A. Jenkins
- G01 - MEASURING TESTING
Information Patent Application
ON-CHIP LEAKAGE MEASUREMENT
- Publication number 20170254846
- Publication date Sep 7, 2017
- International Business Machines Corporation
- Chen-Yong Cher
- G01 - MEASURING TESTING
Information Patent Application
REDUCING DARK CURRENT IN GERMANIUM PHOTODIODES BY ELECTRICAL OVER-S...
- Publication number 20170222083
- Publication date Aug 3, 2017
- International Business Machines Corporation
- Barry P. Linder
- H01 - BASIC ELECTRIC ELEMENTS

Barry P. Linder

Person

Patents Grantslast 30 patents

Gate stacks with multiple high-κ dielectric layers

RRAM structures in the BEOL

Fabrication of phase change memory cell in integrated circuit

Switchable metal insulator metal capacitor

Detection of performance degradation in integrated circuits

Measuring individual device degradation in CMOS circuits

Fabrication of phase change memory cell in integrated circuit

BTI degradation test circuit

Dynamic predictor of semiconductor lifetime limits

Analytics to determine customer satisfaction

Reduction of negative bias temperature instability

Reducing dark current in germanium photodiodes by electrical over-s...

Non-destructive analysis to determine use history of processor

Touch movement activation for gaining access beyond a restricted ac...

On-chip combined hot carrier injection and bias temperature instabi...

Autonomic supply voltage compensation for degradation of circuits o...

Analytics to determine customer satisfaction

Three plate MIM capacitor via integrity verification

Reducing dark current in germanium photodiodes by electrical over-s...

Measuring individual device degradation in CMOS circuits

Reducing dark current in germanium photodiodes by electrical over-s...

Three plate MIM capacitor via integrity verification

Reduction of negative bias temperature instability

Reduction of negative bias temperature instability

Test structures for dielectric reliability evaluations

Non-destructive analysis to determine use history of processor

Reducing dark current in germanium photodiodes by electrical over-s...

On-chip combined hot carrier injection and bias temperature instabi...

Measurement for transistor output characteristics with and without...

Selective thickening of pFET dielectric

Patents Applicationslast 30 patents

TIME DEPENDENT DIELECTRIC BREAKDOWN RELIABILITY TESTING OF A SRAM

INNER SPACER RELIABILITY MACRO DESIGN AND WELL CONTACT FORMATION

STRUCTURE TO FORM AND INTEGRATE HIGH VOLTAGE FINFET I/O DEVICE WITH...

GATE STACKS WITH MULTIPLE HIGH-K DIELECTRIC LAYERS

RRAM STRUCTURES IN THE BEOL

SWITCHABLE METAL INSULATOR METAL CAPACITOR

FABRICATION OF PHASE CHANGE MEMORY CELL IN INTEGRATED CIRCUIT

FABRICATION OF PHASE CHANGE MEMORY CELL IN INTEGRATED CIRCUIT

ENERGY STORAGE COMPONENT DELIVERY SYSTEM

DETECTION OF PERFORMANCE DEGRADATION IN INTEGRATED CIRCUITS

ANALYTICS TO DETERMINE CUSTOMER SATISFACTION

REDUCTION OF NEGATIVE BIAS TEMPERATURE INSTABILITY

MEASURING INDIVIDUAL DEVICE DEGRADATION IN CMOS CIRCUITS

NON-DESTRUCTIVE ANALYSIS TO DETERMINE USE HISTORY OF PROCESSOR

Autonomic Supply Voltage Compensation for Degradation of Circuits o...

REDUCING DARK CURRENT IN GERMANIUM PHOTODIODES BY ELECTRICAL OVER-S...

THREE PLATE MIM CAPACITOR VIA INTEGRITY VERIFICATION

THREE PLATE MIM CAPACITOR VIA INTEGRITY VERIFICATION

ON-CHIP COMBINED HOT CARRIER INJECTION AND BIAS TEMPERATURE INSTABI...

REDUCING DARK CURRENT IN GERMANIUM PHOTODIODES BY ELECTRICAL OVER-S...

DYNAMIC PREDICTOR OF SEMICONDUCTOR LIFETIME LIMITS

TOUCH MOVEMENT ACTIVATION FOR GAINING ACCESS BEYOND A RESTRICTED AC...

ANALYTICS TO DETERMINE CUSTOMER SATISFACTION

REDUCING DARK CURRENT IN GERMANIUM PHOTODIODES BY ELECTRICAL OVER-S...

TEST CIRCUIT TO ISOLATE HCI DEGRADATION

NON-DESTRUCTIVE ANALYSIS TO DETERMINE USE HISTORY OF PROCESSOR

TOUCH MOVEMENT ACTIVATION FOR GAINING ACCESS BEYOND A RESTRICTED AC...

BTI DEGRADATION TEST CIRCUIT

ON-CHIP LEAKAGE MEASUREMENT

REDUCING DARK CURRENT IN GERMANIUM PHOTODIODES BY ELECTRICAL OVER-S...