Bart Buijsse

Person

Eindhoven, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Method and system for generating a diffraction image
- Patent number 12,009,176
- Issue date Jun 11, 2024
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system to determine crystal structure
- Patent number 11,988,618
- Issue date May 21, 2024
- FEI Company
- Bart Buijsse
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for acquiring three-dimensional electron diffra...
- Patent number 11,815,476
- Issue date Nov 14, 2023
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for generating a diffraction image
- Patent number 11,694,874
- Issue date Jul 4, 2023
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and systems for acquiring 3D diffraction data
- Patent number 11,456,149
- Issue date Sep 27, 2022
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dual beam microscope system for imaging during sample processing
- Patent number 11,183,364
- Issue date Nov 23, 2021
- FEI Company
- Yuchen Deng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Laser-based phase plate image contrast manipulation
- Patent number 11,101,101
- Issue date Aug 24, 2021
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Diffraction pattern detection in a transmission charged particle mi...
- Patent number 11,004,655
- Issue date May 11, 2021
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for determining molecular structure
- Patent number 10,935,506
- Issue date Mar 2, 2021
- FEI Company
- Bart Buijsse
- G01 - MEASURING TESTING
Information Patent Grant
Diffraction pattern detection in a transmission charged particle mi...
- Patent number 10,651,008
- Issue date May 12, 2020
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray imaging technique
- Patent number 10,545,100
- Issue date Jan 28, 2020
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Arrangement for X-Ray tomography
- Patent number 9,958,403
- Issue date May 1, 2018
- FEI Company
- Pavel Stejskal
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Method of producing a freestanding thin film of nano-crystalline gr...
- Patent number 9,908,778
- Issue date Mar 6, 2018
- FEI Company
- Bart Buijsse
- C01 - INORGANIC CHEMISTRY
Information Patent Grant
User interface for an electron microscope
- Patent number 9,865,427
- Issue date Jan 9, 2018
- FEI Company
- Martinus Petrus Maria Bierhoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Aligning a featureless thin film in a TEM
- Patent number 9,583,303
- Issue date Feb 28, 2017
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of examining a sample in a charged-particle microscope
- Patent number 9,312,098
- Issue date Apr 12, 2016
- FEI Company
- Ivan Lazic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Correlative optical and charged particle microscope
- Patent number 9,293,297
- Issue date Mar 22, 2016
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of using a phase plate in a transmission electron microscope
- Patent number 9,129,774
- Issue date Sep 8, 2015
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
User interface for an electron microscope
- Patent number 9,025,018
- Issue date May 5, 2015
- FEI Company
- Martinus Petrus Maria Bierhoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Phase shift method for a TEM
- Patent number 9,006,652
- Issue date Apr 14, 2015
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Imaging a sample in a TEM equipped with a phase plate
- Patent number 8,835,846
- Issue date Sep 16, 2014
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Phase plate for a TEM
- Patent number 8,772,716
- Issue date Jul 8, 2014
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Environmental cell for a particle-optical apparatus
- Patent number 8,658,974
- Issue date Feb 25, 2014
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Blocking member for use in the diffraction plane of a TEM
- Patent number 8,637,821
- Issue date Jan 28, 2014
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for centering an optical element in a TEM comprising a contr...
- Patent number 8,633,456
- Issue date Jan 21, 2014
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Compact scanning electron microscope
- Patent number 8,309,921
- Issue date Nov 13, 2012
- FEI Company
- Martinus Petrus Maria Bierhoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Environmental cell for a particle-optical apparatus
- Patent number 8,093,558
- Issue date Jan 10, 2012
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Compact scanning electron microscope
- Patent number 7,906,762
- Issue date Mar 15, 2011
- FEI Company
- Mart Petrus Maria Bierhoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for evacuating a sample
- Patent number 7,456,413
- Issue date Nov 25, 2008
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of localizing fluorescent markers
- Patent number 7,317,515
- Issue date Jan 8, 2008
- Bart Buijsse
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
POLE PIECE INCORPORATING OPTICAL CAVITY FOR IMPROVED PHASE-CONTRAST...
- Publication number 20240203685
- Publication date Jun 20, 2024
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND SYSTEMS FOR DETERMINING THE ABSOLUTE STRUCTURE OF CRYSTAL
- Publication number 20240077436
- Publication date Mar 7, 2024
- FEI Company
- Stefano VESPUCCI
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR GENERATING A DIFFRACTION IMAGE
- Publication number 20230298853
- Publication date Sep 21, 2023
- FEI Company
- Bart BUIJSSE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR GENERATING A DIFFRACTION IMAGE
- Publication number 20230020957
- Publication date Jan 19, 2023
- FEI Company
- Bart BUIJSSE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND SYSTEMS FOR ACQUIRING THREE-DIMENSIONAL ELECTRON DIFFRA...
- Publication number 20220317066
- Publication date Oct 6, 2022
- FEI Company
- Bart BUIJSSE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM TO DETERMINE CRYSTAL STRUCTURE
- Publication number 20220317067
- Publication date Oct 6, 2022
- FEI Company
- Bart BUIJSSE
- G01 - MEASURING TESTING
Information Patent Application
DUAL BEAM MICROSCOPE SYSTEM FOR IMAGING DURING SAMPLE PROCESSING
- Publication number 20210391145
- Publication date Dec 16, 2021
- FEI Company
- Yuchen Deng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND SYSTEMS FOR ACQUIRING 3D DIFFRACTION DATA
- Publication number 20210305010
- Publication date Sep 30, 2021
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR DETERMINING MOLECULAR STRUCTURE
- Publication number 20200400594
- Publication date Dec 24, 2020
- FEI Company
- Bart Buijsse
- G01 - MEASURING TESTING
Information Patent Application
LASER-BASED PHASE PLATE IMAGE CONTRAST MANIPULATION
- Publication number 20200365366
- Publication date Nov 19, 2020
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DIFFRACTION PATTERN DETECTION IN A TRANSMISSION CHARGED PARTICLE MI...
- Publication number 20200144022
- Publication date May 7, 2020
- FEI Company
- Bart BUIJSSE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Diffraction Pattern Detection In A Transmission Charged Particle Mi...
- Publication number 20190057836
- Publication date Feb 21, 2019
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ARRANGEMENT FOR X-RAY TOMOGRAPHY
- Publication number 20180100815
- Publication date Apr 12, 2018
- FEI Company
- Pavel Stejskal
- G01 - MEASURING TESTING
Information Patent Application
NOVEL X-RAY IMAGING TECHNIQUE
- Publication number 20170138870
- Publication date May 18, 2017
- FEI Company
- Bart Buijsse
- G01 - MEASURING TESTING
Information Patent Application
ALIGNING A FEATURELESS THIN FILM IN A TEM
- Publication number 20160104596
- Publication date Apr 14, 2016
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of Producing a Freestanding Thin Film of Nano-Crystalline Ca...
- Publication number 20160096734
- Publication date Apr 7, 2016
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
USER INTERFACE FOR AN ELECTRON MICROSCOPE
- Publication number 20150332891
- Publication date Nov 19, 2015
- FEI Company
- MART PETRUS MARIA BIERHOFF
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF EXAMINING A SAMPLE IN A CHARGED-PARTICLE MICROSCOPE
- Publication number 20150243474
- Publication date Aug 27, 2015
- FEI Company
- Ivan Lazic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CORRELATIVE OPTICAL AND CHARGED PARTICLE MICROSCOPE
- Publication number 20150214001
- Publication date Jul 30, 2015
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF PRODUCING A FREESTANDING THIN FILM OF NANO-CRYSTALLINE GR...
- Publication number 20150151972
- Publication date Jun 4, 2015
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF USING A PHASE PLATE IN A TRANSMISSION ELECTRON MICROSCOPE
- Publication number 20140326876
- Publication date Nov 6, 2014
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PHASE SHIFT METHOD FOR A TEM
- Publication number 20140326878
- Publication date Nov 6, 2014
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of Observing Samples with a Fluorescent Microscope
- Publication number 20140203191
- Publication date Jul 24, 2014
- FEI Company
- Bart Buijsse
- G02 - OPTICS
Information Patent Application
IMAGING A SAMPLE IN A TEM EQUIPPED WITH A PHASE PLATE
- Publication number 20140061463
- Publication date Mar 6, 2014
- Max-Planck-Gesellschaft zur Gorderung der Wissenschaften e.V.
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Phase Plate for a TEM
- Publication number 20130313428
- Publication date Nov 28, 2013
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Centering an Optical Element in a TEM Comprising a Contr...
- Publication number 20120199756
- Publication date Aug 9, 2012
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Environmental cell for a particle-optical apparatus
- Publication number 20120091338
- Publication date Apr 19, 2012
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Blocking Member for Use in the Diffraction Plane of a TEM
- Publication number 20110315876
- Publication date Dec 29, 2011
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPACT SCANNING ELECTRON MICROSCOPE
- Publication number 20110133083
- Publication date Jun 9, 2011
- FEI Company
- MART PETRUS MARIA BIERHOFF
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Compact Scanning Electron Microscope
- Publication number 20100230590
- Publication date Sep 16, 2010
- FEI Company
- Mart Petrus Maria Bierhoff
- H01 - BASIC ELECTRIC ELEMENTS

Bart Buijsse

Person

Patents Grantslast 30 patents

Method and system for generating a diffraction image

Method and system to determine crystal structure

Methods and systems for acquiring three-dimensional electron diffra...

Method and system for generating a diffraction image

Methods and systems for acquiring 3D diffraction data

Dual beam microscope system for imaging during sample processing

Laser-based phase plate image contrast manipulation

Diffraction pattern detection in a transmission charged particle mi...

Method and system for determining molecular structure

Diffraction pattern detection in a transmission charged particle mi...

X-ray imaging technique

Arrangement for X-Ray tomography

Method of producing a freestanding thin film of nano-crystalline gr...

User interface for an electron microscope

Aligning a featureless thin film in a TEM

Method of examining a sample in a charged-particle microscope

Correlative optical and charged particle microscope

Method of using a phase plate in a transmission electron microscope

User interface for an electron microscope

Phase shift method for a TEM

Imaging a sample in a TEM equipped with a phase plate

Phase plate for a TEM

Environmental cell for a particle-optical apparatus

Blocking member for use in the diffraction plane of a TEM

Method for centering an optical element in a TEM comprising a contr...

Compact scanning electron microscope

Environmental cell for a particle-optical apparatus

Compact scanning electron microscope

Apparatus for evacuating a sample

Method of localizing fluorescent markers

Patents Applicationslast 30 patents

POLE PIECE INCORPORATING OPTICAL CAVITY FOR IMPROVED PHASE-CONTRAST...

METHODS AND SYSTEMS FOR DETERMINING THE ABSOLUTE STRUCTURE OF CRYSTAL

METHOD AND SYSTEM FOR GENERATING A DIFFRACTION IMAGE

METHOD AND SYSTEM FOR GENERATING A DIFFRACTION IMAGE

METHODS AND SYSTEMS FOR ACQUIRING THREE-DIMENSIONAL ELECTRON DIFFRA...

METHOD AND SYSTEM TO DETERMINE CRYSTAL STRUCTURE

DUAL BEAM MICROSCOPE SYSTEM FOR IMAGING DURING SAMPLE PROCESSING

METHODS AND SYSTEMS FOR ACQUIRING 3D DIFFRACTION DATA

METHOD AND SYSTEM FOR DETERMINING MOLECULAR STRUCTURE

LASER-BASED PHASE PLATE IMAGE CONTRAST MANIPULATION

DIFFRACTION PATTERN DETECTION IN A TRANSMISSION CHARGED PARTICLE MI...

Diffraction Pattern Detection In A Transmission Charged Particle Mi...

ARRANGEMENT FOR X-RAY TOMOGRAPHY

NOVEL X-RAY IMAGING TECHNIQUE

ALIGNING A FEATURELESS THIN FILM IN A TEM

Method of Producing a Freestanding Thin Film of Nano-Crystalline Ca...

USER INTERFACE FOR AN ELECTRON MICROSCOPE

METHOD OF EXAMINING A SAMPLE IN A CHARGED-PARTICLE MICROSCOPE

CORRELATIVE OPTICAL AND CHARGED PARTICLE MICROSCOPE

METHOD OF PRODUCING A FREESTANDING THIN FILM OF NANO-CRYSTALLINE GR...

METHOD OF USING A PHASE PLATE IN A TRANSMISSION ELECTRON MICROSCOPE

PHASE SHIFT METHOD FOR A TEM

Method of Observing Samples with a Fluorescent Microscope

IMAGING A SAMPLE IN A TEM EQUIPPED WITH A PHASE PLATE

Phase Plate for a TEM

Method for Centering an Optical Element in a TEM Comprising a Contr...

Environmental cell for a particle-optical apparatus

Blocking Member for Use in the Diffraction Plane of a TEM

COMPACT SCANNING ELECTRON MICROSCOPE

Compact Scanning Electron Microscope