Bart Jozef Janssen

Person

Eindhoven, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Rotating sample holder for random angle sampling in tomography
- Patent number 12,074,007
- Issue date Aug 27, 2024
- FEI Company
- Bart Jozef Janssen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for generating a diffraction image
- Patent number 12,009,176
- Issue date Jun 11, 2024
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measurement and correction of optical aberrations in charged partic...
- Patent number 11,990,315
- Issue date May 21, 2024
- FEI Company
- Erik Franken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Rotating sample holder for random angle sampling in tomography
- Patent number 11,756,762
- Issue date Sep 12, 2023
- FEI Company
- Bart Jozef Janssen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Defective pixel management in charged particle microscopy
- Patent number 11,742,175
- Issue date Aug 29, 2023
- FEI Company
- Erik Michiel Franken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for generating a diffraction image
- Patent number 11,694,874
- Issue date Jul 4, 2023
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-gated detection, dual-layer SPAD-based electron detection
- Patent number 11,551,906
- Issue date Jan 10, 2023
- FEI Company
- Bart Jozef Janssen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing a charged particle detector
- Patent number 11,417,498
- Issue date Aug 16, 2022
- FEI Company
- Bart Jozef Janssen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for high speed signal processing
- Patent number 11,297,276
- Issue date Apr 5, 2022
- FEI Company
- Henricus Gerardus Roeven
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Rotating sample holder for random angle sampling in tomography
- Patent number 11,257,656
- Issue date Feb 22, 2022
- FEI Company
- Bart Jozef Janssen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of imaging a sample using an electron microscope
- Patent number 10,937,625
- Issue date Mar 2, 2021
- FEI Company
- Erik Michiel Franken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Innovative imaging technique in transmission charged particle micro...
- Patent number 10,825,647
- Issue date Nov 3, 2020
- FEI Company
- Bart Jozef Janssen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pulse processing
- Patent number 10,692,691
- Issue date Jun 23, 2020
- FEI Company
- Nikolaos Kontaras
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Intelligent pre-scan in scanning transmission charged particle micr...
- Patent number 10,665,419
- Issue date May 26, 2020
- FEI Company
- Erik Michiel Franken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pulse processing
- Patent number 10,403,470
- Issue date Sep 3, 2019
- FEI Company
- Nikolaos Kontaras
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for detecting particulate radiation
- Patent number 10,389,955
- Issue date Aug 20, 2019
- FEI Company
- Bart Jozef Janssen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for detecting particulate radiation
- Patent number 10,122,946
- Issue date Nov 6, 2018
- FEI Company
- Bart Jozef Janssen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Innovative image processing in charged particle microscopy
- Patent number 10,014,158
- Issue date Jul 3, 2018
- FEI Company
- Bart Jozef Janssen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of imaging a specimen using ptychography
- Patent number 10,008,363
- Issue date Jun 26, 2018
- FEI Company
- Eric Gerardus Theodoor Bosch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of investigating the wavefront of a charged-particle beam
- Patent number 9,202,670
- Issue date Dec 1, 2015
- FEI Company
- Bart Jozef Janssen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for acquiring data with an image sensor
- Patent number 8,817,148
- Issue date Aug 26, 2014
- FEI Company
- Bart Jozef Janssen
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method of preparing and imaging a lamella in a particle-optical app...
- Patent number 8,766,214
- Issue date Jul 1, 2014
- FEI Company
- Brian Roberts Routh
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ROTATING SAMPLE HOLDER FOR RANDOM ANGLE SAMPLING IN TOMOGRAPHY
- Publication number 20230377835
- Publication date Nov 23, 2023
- FEI Company
- Bart Jozef Janssen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR GENERATING A DIFFRACTION IMAGE
- Publication number 20230298853
- Publication date Sep 21, 2023
- FEI Company
- Bart BUIJSSE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEASUREMENT AND CORRECTION OF OPTICAL ABERRATIONS IN CHARGED PARTIC...
- Publication number 20230274908
- Publication date Aug 31, 2023
- FEI Company
- Erik Franken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR GENERATING A DIFFRACTION IMAGE
- Publication number 20230020957
- Publication date Jan 19, 2023
- FEI Company
- Bart BUIJSSE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME-GATED DETECTION, DUAL-LAYER SPAD-BASED ELECTRON DETECTION
- Publication number 20230005705
- Publication date Jan 5, 2023
- FEI Company
- Bart Jozef Janssen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEFECTIVE PIXEL MANAGEMENT IN CHARGED PARTICLE MICROSCOPY
- Publication number 20230005702
- Publication date Jan 5, 2023
- FEI Company
- Erik Michiel FRANKEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STROBOSCOPIC ILLUMINATION SYNCHRONIZED ELECTRON DETECTION AND IMAGING
- Publication number 20220208510
- Publication date Jun 30, 2022
- FEI Company
- Bart Jozef Janssen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ROTATING SAMPLE HOLDER FOR RANDOM ANGLE SAMPLING IN TOMOGRAPHY
- Publication number 20220157557
- Publication date May 19, 2022
- FEI Company
- Bart Jozef Janssen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR HIGH SPEED SIGNAL PROCESSING
- Publication number 20220103771
- Publication date Mar 31, 2022
- FEI Company
- Henricus Gerardus ROEVEN
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
ROTATING SAMPLE HOLDER FOR RANDOM ANGLE SAMPLING IN TOMOGRAPHY
- Publication number 20210319975
- Publication date Oct 14, 2021
- FEI Company
- Bart Jozef Janssen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MANUFACTURING A CHARGED PARTICLE DETECTOR
- Publication number 20210020400
- Publication date Jan 21, 2021
- FEI Company
- Bart Jozef Janssen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF IMAGING A SAMPLE USING AN ELECTRON MICROSCOPE
- Publication number 20200168433
- Publication date May 28, 2020
- FEI Company
- Erik Michiel Franken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PULSE PROCESSING
- Publication number 20190362932
- Publication date Nov 28, 2019
- FEI Company
- Nikolaos Kontaras
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTELLIGENT PRE-SCAN IN SCANNING TRANSMISSION CHARGED PARTICLE MICR...
- Publication number 20190295814
- Publication date Sep 26, 2019
- FEI Company
- Erik Michiel FRANKEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INNOVATIVE IMAGING TECHNIQUE IN TRANSMISSION CHARGED PARTICLE MICRO...
- Publication number 20190228949
- Publication date Jul 25, 2019
- FEI Company
- Bart Jozef JANSSEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR DETECTING PARTICULATE RADIATION
- Publication number 20190075258
- Publication date Mar 7, 2019
- FEI Company
- Bart Josef Janssen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF IMAGING A SPECIMEN USING PTYCHOGRAPHY
- Publication number 20180019098
- Publication date Jan 18, 2018
- FEI Company
- Eric Gerardus Theodoor Bosch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR DETECTING PARTICULATE RADIATION
- Publication number 20170134674
- Publication date May 11, 2017
- FEI Company
- Bart Jozef Janssen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PULSE PROCESSING
- Publication number 20160254119
- Publication date Sep 1, 2016
- FEI Company
- Nikolaos Kontaras
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF INVESTIGATING THE WAVEFRONT OF A CHARGED-PARTICLE BEAM
- Publication number 20150170876
- Publication date Jun 18, 2015
- FEI Company
- Bart Jozef Janssen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF PREPARING AND IMAGING A LAMELLA IN A PARTICLE-OPTICAL APP...
- Publication number 20140007307
- Publication date Jan 2, 2014
- Brian Roberts Routh
- B82 - NANO-TECHNOLOGY
Information Patent Application
METHOD FOR ACQUIRING DATA WITH AN IMAGE SENSOR
- Publication number 20130093931
- Publication date Apr 18, 2013
- FEI Company
- Bart Jozef Janssen
- H01 - BASIC ELECTRIC ELEMENTS

Bart Jozef Janssen

Person

Patents Grantslast 30 patents

Rotating sample holder for random angle sampling in tomography

Method and system for generating a diffraction image

Measurement and correction of optical aberrations in charged partic...

Rotating sample holder for random angle sampling in tomography

Defective pixel management in charged particle microscopy

Method and system for generating a diffraction image

Time-gated detection, dual-layer SPAD-based electron detection

Method of manufacturing a charged particle detector

Method and system for high speed signal processing

Rotating sample holder for random angle sampling in tomography

Method of imaging a sample using an electron microscope

Innovative imaging technique in transmission charged particle micro...

Pulse processing

Intelligent pre-scan in scanning transmission charged particle micr...

Pulse processing

Method for detecting particulate radiation

Method for detecting particulate radiation

Innovative image processing in charged particle microscopy

Method of imaging a specimen using ptychography

Method of investigating the wavefront of a charged-particle beam

Method for acquiring data with an image sensor

Method of preparing and imaging a lamella in a particle-optical app...

Patents Applicationslast 30 patents

ROTATING SAMPLE HOLDER FOR RANDOM ANGLE SAMPLING IN TOMOGRAPHY

METHOD AND SYSTEM FOR GENERATING A DIFFRACTION IMAGE

MEASUREMENT AND CORRECTION OF OPTICAL ABERRATIONS IN CHARGED PARTIC...

METHOD AND SYSTEM FOR GENERATING A DIFFRACTION IMAGE

TIME-GATED DETECTION, DUAL-LAYER SPAD-BASED ELECTRON DETECTION

DEFECTIVE PIXEL MANAGEMENT IN CHARGED PARTICLE MICROSCOPY

STROBOSCOPIC ILLUMINATION SYNCHRONIZED ELECTRON DETECTION AND IMAGING

ROTATING SAMPLE HOLDER FOR RANDOM ANGLE SAMPLING IN TOMOGRAPHY

METHOD AND SYSTEM FOR HIGH SPEED SIGNAL PROCESSING

ROTATING SAMPLE HOLDER FOR RANDOM ANGLE SAMPLING IN TOMOGRAPHY

METHOD OF MANUFACTURING A CHARGED PARTICLE DETECTOR

METHOD OF IMAGING A SAMPLE USING AN ELECTRON MICROSCOPE

PULSE PROCESSING

INTELLIGENT PRE-SCAN IN SCANNING TRANSMISSION CHARGED PARTICLE MICR...

INNOVATIVE IMAGING TECHNIQUE IN TRANSMISSION CHARGED PARTICLE MICRO...

METHOD FOR DETECTING PARTICULATE RADIATION

METHOD OF IMAGING A SPECIMEN USING PTYCHOGRAPHY

METHOD FOR DETECTING PARTICULATE RADIATION

PULSE PROCESSING

METHOD OF INVESTIGATING THE WAVEFRONT OF A CHARGED-PARTICLE BEAM

METHOD OF PREPARING AND IMAGING A LAMELLA IN A PARTICLE-OPTICAL APP...

METHOD FOR ACQUIRING DATA WITH AN IMAGE SENSOR