Bart Peter Bert Segers

Person

Tessenderlo, BE

People

Patents Grantslast 30 patents

Information Patent Grant
Computational metrology
- Patent number 12,189,302
- Issue date Jan 7, 2025
- ASML Netherlands B.V.
- Wim Tjibbo Tel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Metrology apparatus and method for determining a characteristic rel...
- Patent number 11,385,554
- Issue date Jul 12, 2022
- ASML Netherlands B.V.
- Miguel Garcia Granda
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Computational metrology
- Patent number 11,347,150
- Issue date May 31, 2022
- ASML Netherlands B.V.
- Wim Tjibbo Tel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for determining a fingerprint of a performance...
- Patent number 11,194,258
- Issue date Dec 7, 2021
- ASML Netherlands B.V.
- Léon Maria Albertus Van Der Logt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Computational metrology
- Patent number 11,067,902
- Issue date Jul 20, 2021
- ASML Netherlands B.V.
- Patrick Warnaar
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Computational metrology
- Patent number 10,990,018
- Issue date Apr 27, 2021
- ASML Netherlands B.V.
- Wim Tjibbo Tel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and patterning devices and apparatuses for measuring focus...
- Patent number 10,895,811
- Issue date Jan 19, 2021
- ASML Netherlands B.V.
- Miguel Garcia Granda
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for determining a fingerprint of a performance...
- Patent number 10,649,342
- Issue date May 12, 2020
- ASML Netherlands B.V.
- Léon Maria Albertus Van Der Logt
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of calibrating focus measurements, measurement method and me...
- Patent number 10,571,812
- Issue date Feb 25, 2020
- ASML Netherlands B.V.
- Fahong Li
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Lithographic apparatus and method
- Patent number 9,519,224
- Issue date Dec 13, 2016
- ASML Netherlands B.V.
- Arjan Gijsbertsen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Lithographic apparatus and device manufacturing method
- Patent number 8,446,564
- Issue date May 21, 2013
- ASML Netherlands B.V.
- Gerardus Carolus Johannus Hofmans
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
COMPUTATIONAL METROLOGY
- Publication number 20220260925
- Publication date Aug 18, 2022
- ASML NETHERLANDS B.V.
- Wim Tjibbo TEL
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COMPUTATIONAL METROLOGY
- Publication number 20210349395
- Publication date Nov 11, 2021
- ASML NETHERLANDS B.V.
- Patrick WARNAAR
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
COMPUTATIONAL METROLOGY
- Publication number 20210191278
- Publication date Jun 24, 2021
- ASML NETHERLANDS B.V.
- Wim Tjibbo TEL
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COMPUTATIONAL METROLOGY
- Publication number 20200249576
- Publication date Aug 6, 2020
- ASML NETHERLANDS B.V.
- Patrick WARNAAR
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD AND APPARATUS FOR DETERMINING A FINGERPRINT OF A PERFORMANCE...
- Publication number 20200233310
- Publication date Jul 23, 2020
- ASML NATHERLANDS B. V.
- Léon Maria Albertus VAN DER LOGT
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Methods and Patterning Devices and Apparatuses for Measuring Focus...
- Publication number 20200117101
- Publication date Apr 16, 2020
- ASML NETHERLANDS B.V.
- Miguel GARCIA GRANDA
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Metrology Apparatus and Method for Determining a Characteristic Rel...
- Publication number 20200026182
- Publication date Jan 23, 2020
- ASML NETHERLANDS B.V.
- Miguel GARCIA GRANDA
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
COMPUTATIONAL METROLOGY
- Publication number 20190361358
- Publication date Nov 28, 2019
- ASML NETHERLANDS B.V.
- Wim Tjibbo TEL
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR DETERMINING A FINGERPRINT OF A PERFORMANCE...
- Publication number 20190324371
- Publication date Oct 24, 2019
- ASML NETHERLANDS B.V.
- Léon Maria Albertus VAN DER LOGT
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method of Calibrating Focus Measurements, Measurement Method and Me...
- Publication number 20190056673
- Publication date Feb 21, 2019
- ASML NETHERLANDS B.V.
- Fahong LI
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Lithographic Apparatus and Method
- Publication number 20140313496
- Publication date Oct 23, 2014
- ASML NETHERLANDS B.V.
- Arjan Gijsbertsen
- G01 - MEASURING TESTING

Bart Peter Bert Segers

Person

Patents Grantslast 30 patents

Computational metrology

Metrology apparatus and method for determining a characteristic rel...

Computational metrology

Method and apparatus for determining a fingerprint of a performance...

Computational metrology

Computational metrology

Methods and patterning devices and apparatuses for measuring focus...

Method and apparatus for determining a fingerprint of a performance...

Method of calibrating focus measurements, measurement method and me...

Lithographic apparatus and method

Lithographic apparatus and device manufacturing method

Patents Applicationslast 30 patents

COMPUTATIONAL METROLOGY

COMPUTATIONAL METROLOGY

COMPUTATIONAL METROLOGY

COMPUTATIONAL METROLOGY

METHOD AND APPARATUS FOR DETERMINING A FINGERPRINT OF A PERFORMANCE...

Methods and Patterning Devices and Apparatuses for Measuring Focus...

Metrology Apparatus and Method for Determining a Characteristic Rel...

COMPUTATIONAL METROLOGY

METHOD AND APPARATUS FOR DETERMINING A FINGERPRINT OF A PERFORMANCE...

Method of Calibrating Focus Measurements, Measurement Method and Me...

Lithographic Apparatus and Method