Bart Van Coppenolle

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Linden, BE

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Patents Grantslast 30 patents

Information Patent Grant
Method and computer program for improving the dimensional acquisiti...
- Patent number 8,520,930
- Issue date Aug 27, 2013
- 3D Scanners Ltd.
- Bart Van Coppenolle
- G01 - MEASURING TESTING
Information Patent Grant
Method, device and computer program for evaluating an object using...
- Patent number 7,672,810
- Issue date Mar 2, 2010
- 3D Scanners Ltd.
- Bart Van Coppenolle
- G01 - MEASURING TESTING
Information Patent Grant
Method for the automatic simultaneous synchronization, calibration...
- Patent number 7,299,145
- Issue date Nov 20, 2007
- Metris N.V.
- Lieven De Jonge
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical probe for scanning the features of an object and methods th...
- Patent number 7,009,717
- Issue date Mar 7, 2006
- Metris N.V.
- Bart Van Coppenolle
- G01 - MEASURING TESTING
Information Patent Grant
Method for the automatic calibration-only, or calibration and quali...
- Patent number 6,944,564
- Issue date Sep 13, 2005
- Metris N.V.
- Lieven De Jonge
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and computer program for improving the dimensional acquisiti...
- Publication number 20110123097
- Publication date May 26, 2011
- Bart Van Coppenolle
- G01 - MEASURING TESTING
Information Patent Application
Method for the automatic simultaneous synchronization, calibration...
- Publication number 20070043526
- Publication date Feb 22, 2007
- Metris N.V.
- Lieven De Jonge
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method, device and computer program for evaluating an object using...
- Publication number 20070032901
- Publication date Feb 8, 2007
- Bart Van Coppenolle
- G05 - CONTROLLING REGULATING
Information Patent Application
Optical probe for scanning the features of an object and methods th...
- Publication number 20060215176
- Publication date Sep 28, 2006
- Bart Van Coppenolle
- G01 - MEASURING TESTING
Information Patent Application
Optical probe for scanning the features of an object and methods th...
- Publication number 20040130729
- Publication date Jul 8, 2004
- Bart Van Coppenolle
- G01 - MEASURING TESTING
Information Patent Application
Method for the automatic calibration-only, or calibration and quali...
- Publication number 20040021876
- Publication date Feb 5, 2004
- Lieven De Jonge
- G01 - MEASURING TESTING