Membership
Tour
Register
Log in
Barton E. Dahneke
Follow
Person
Palmyra, NY, US
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Method of characterizing particles by multiple time-of-flight measu...
Patent number
5,641,919
Issue date
Jun 24, 1997
Barton E. Dahneke
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for measuring motion of a suspended particle o...
Patent number
5,627,308
Issue date
May 6, 1997
Barton E. Dahneke
G01 - MEASURING TESTING
Information
Patent Grant
Characterization of particles by modulated dynamic light scattering
Patent number
5,502,561
Issue date
Mar 26, 1996
Board of Trustees of the University of Arkansas
Darrell K. Hutchins
G01 - MEASURING TESTING
Information
Patent Grant
Characterization of particles by modulated dynamic light scattering
Patent number
5,434,667
Issue date
Jul 18, 1995
Eastman Kodak Company
Darrell K. Hutchins
G01 - MEASURING TESTING
Information
Patent Grant
Beam forming apparatus for aerodynamic particle sizing system
Patent number
4,917,494
Issue date
Apr 17, 1990
Amherst Process Instruments, Inc.
Trent A. Poole
G02 - OPTICS
Information
Patent Grant
Sealed optical disk unit, apparatus and method for debris-suppresse...
Patent number
4,519,061
Issue date
May 21, 1985
Eastman Kodak Company
Barton E. Dahneke
G11 - INFORMATION STORAGE
Information
Patent Grant
Apparatus for separation of gas borne particles
Patent number
4,358,302
Issue date
Nov 9, 1982
The University of Rochester
Barton E. Dahneke
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL