Barton E. Green

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Milton, VT, US

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Patents Grantslast 30 patents

Information Patent Grant
High power radio frequency (RF) in-line wafer testing
- Patent number 9,599,657
- Issue date Mar 21, 2017
- GLOBALFOUNDRIES Inc.
- Hanyi Ding
- G01 - MEASURING TESTING
Information Patent Grant
High-frequency cobra probe
- Patent number 8,994,393
- Issue date Mar 31, 2015
- International Business Machines Corporation
- Hanyi Ding
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit having register configuration sets
- Patent number 6,941,435
- Issue date Sep 6, 2005
- International Business Machines Corporation
- Anthony R. Bonaccio
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
HIGH POWER RADIO FREQUENCY (RF) IN-LINE WAFER TESTING
- Publication number 20140184258
- Publication date Jul 3, 2014
- International Business Machines Corporation
- Hanyi DING
- G01 - MEASURING TESTING
Information Patent Application
HIGH-FREQUENCY COBRA PROBE
- Publication number 20140062519
- Publication date Mar 6, 2014
- International Business Machines Corporation
- Hanyi DING
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT HAVING REGISTER CONFIGURATION SETS
- Publication number 20040143715
- Publication date Jul 22, 2004
- International Business Machines Corporation
- Anthony R. Bonaccio
- G06 - COMPUTING CALCULATING COUNTING