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Pleasanton, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Method and apparatus for the measurement of atmospheric leaks in th...
Patent number
8,393,197
Issue date
Mar 12, 2013
Pivotal Systems Corporation
Joseph R. Monkowski
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for identifying the chemical composition of a gas
Patent number
8,237,928
Issue date
Aug 7, 2012
Pivotal Systems Corporation
Joseph R. Monkowski
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for identifying the chemical composition of a gas
Patent number
7,940,395
Issue date
May 10, 2011
Pivotal Systems Corporation
Joseph R. Monkowski
G01 - MEASURING TESTING
Information
Patent Grant
End point detection method for plasma etching of semiconductor wafe...
Patent number
7,871,830
Issue date
Jan 18, 2011
Pivotal Systems Corporation
Sumer S. Johal
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Techniques for calibration of gas flows
Patent number
7,757,541
Issue date
Jul 20, 2010
Pivotal Systems Corporation
Joseph R. Monkowski
G01 - MEASURING TESTING
Information
Patent Grant
Use of modeled parameters for real-time semiconductor process metro...
Patent number
7,695,984
Issue date
Apr 13, 2010
Pivotal Systems Corporation
Joseph R Monkowski
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
METHOD AND APPARATUS FOR IDENTIFYING THE CHEMICAL COMPOSITION OF A GAS
Publication number
20110177625
Publication date
Jul 21, 2011
Pivotal Systems Corporation
Joseph R. Monkowski
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR THE MEASUREMENT OF ATMOSPHERIC LEAKS IN TH...
Publication number
20100018293
Publication date
Jan 28, 2010
Pivotal Systems Corporation
Joseph R. Monkowski
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR IDENTIFYING THE CHEMICAL COMPOSITION OF A GAS
Publication number
20090180113
Publication date
Jul 16, 2009
Pivotal Systems Corporation
Joseph R. Monkowski
G01 - MEASURING TESTING
Information
Patent Application
End point detection method for plasma etching of semiconductor wafe...
Publication number
20060157446
Publication date
Jul 20, 2006
Sumer Johel
H01 - BASIC ELECTRIC ELEMENTS