Barton T. Hickman

Person

Portland, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Precision, high bandwidth, switching attenuator
- Patent number 11,808,786
- Issue date Nov 7, 2023
- Tektronix, Inc.
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Grant
Frequency converter accessory for a test and measurement instrument
- Patent number 11,619,657
- Issue date Apr 4, 2023
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Grant
Automatic probe ground connection checking techniques
- Patent number 11,454,651
- Issue date Sep 27, 2022
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for synchronizing multiple test and measurement...
- Patent number 11,372,025
- Issue date Jun 28, 2022
- Tektronix, Inc.
- Daniel G. Knierim
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Automatic probe ground connection checking techniques
- Patent number 11,249,111
- Issue date Feb 15, 2022
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Grant
Calibration for test and measurement instrument including asynchron...
- Patent number 11,041,884
- Issue date Jun 22, 2021
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for synchronizing multiple test and measurement...
- Patent number 11,002,764
- Issue date May 11, 2021
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Grant
Noise reduction in digitizing systems
- Patent number 10,502,763
- Issue date Dec 10, 2019
- Tektronix, Inc.
- Barton T. Hickman
- G01 - MEASURING TESTING
Information Patent Grant
Calibration for test and measurement instrument including asynchron...
- Patent number 10,330,705
- Issue date Jun 25, 2019
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Grant
Automatic probe ground connection checking techniques
- Patent number 10,041,975
- Issue date Aug 7, 2018
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Grant
Multi-scope control and synchronization system
- Patent number 9,651,579
- Issue date May 16, 2017
- Tektronix, Inc.
- Barton T. Hickman
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Calibration for test and measurement instrument including asynchron...
- Patent number 9,568,503
- Issue date Feb 14, 2017
- Tektronix, Inc.
- Daniel G. Knierim
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Automatic probe ground connection checking techniques
- Patent number 9,194,888
- Issue date Nov 24, 2015
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Grant
Generating a trigger from a differential signal
- Patent number 7,868,664
- Issue date Jan 11, 2011
- Tektronix, Inc.
- Gene L. Markozen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Mode selection amplifier circuit usable in a signal acquisition probe
- Patent number 7,408,406
- Issue date Aug 5, 2008
- Tektronix, Inc.
- Barton T. Hickman
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Stable in-phase/quadrature (I/Q) generator method and apparatus
- Patent number 6,804,306
- Issue date Oct 12, 2004
- Tektronix, Inc.
- Daniel G. Knierim
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Smart probe apparatus and method for automatic self-adjustment of a...
- Patent number 6,725,170
- Issue date Apr 20, 2004
- Tektronix, Inc.
- Barton T. Hickman
- G01 - MEASURING TESTING
Information Patent Grant
Measurement test instrument and associated voltage management syste...
- Patent number 6,629,048
- Issue date Sep 30, 2003
- Tektronix, Inc.
- William Q. Law
- G01 - MEASURING TESTING
Information Patent Grant
Low-noise four-quadrant multiplier method and apparatus
- Patent number 6,563,365
- Issue date May 13, 2003
- Tektronix, Inc.
- Daniel G. Knierim
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
PRECISION, HIGH BANDWIDTH, SWITCHING ATTENUATOR
- Publication number 20240069065
- Publication date Feb 29, 2024
- Tektronix, Inc.
- JULIE A. CAMPBELL
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC DETERMINATION OF SPECTRUM AND SPECTROGRAM ATTRIBUTES IN A...
- Publication number 20230221352
- Publication date Jul 13, 2023
- Tektronix, Inc.
- Gary J. Waldo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTIPLE SAMPLE-RATE DATA CONVERTER
- Publication number 20220407523
- Publication date Dec 22, 2022
- Tektronix, Inc.
- Joshua J. O'Brien
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
PRECISION, HIGH BANDWIDTH, SWITCHING ATTENUATOR
- Publication number 20220326278
- Publication date Oct 13, 2022
- Tektronix, Inc.
- JULIE A. CAMPBELL
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR SYNCHRONIZING MULTIPLE TEST AND MEASUREMENT...
- Publication number 20210263076
- Publication date Aug 26, 2021
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Application
FREQUENCY CONVERTER ACCESSORY FOR A TEST AND MEASUREMENT INSTRUMENT
- Publication number 20210148951
- Publication date May 20, 2021
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Application
Automatic Probe Ground Connection Checking Techniques
- Publication number 20210088553
- Publication date Mar 25, 2021
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL PATH CALIBRATION OF A HARDWARE SETTING IN A TEST AND MEASURE...
- Publication number 20210063488
- Publication date Mar 4, 2021
- Tektronix, Inc.
- Barton T. Hickman
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR SYNCHRONIZING MULTIPLE TEST AND MEASUREMENT...
- Publication number 20200256893
- Publication date Aug 13, 2020
- Tektronix, Inc.
- Daniel G. Knierim
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
CALIBRATION FOR TEST AND MEASUREMENT INSTRUMENT INCLUDING ASYNCHRON...
- Publication number 20190377008
- Publication date Dec 12, 2019
- Tektronix, Inc.
- Daniel G. Knierim
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Automatic Probe Ground Connection Checking Techniques
- Publication number 20180313870
- Publication date Nov 1, 2018
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Application
NOISE REDUCTION IN DIGITIZING SYSTEMS
- Publication number 20170328932
- Publication date Nov 16, 2017
- Tektronix, Inc.
- Barton T. Hickman
- G01 - MEASURING TESTING
Information Patent Application
CALIBRATION FOR TEST AND MEASUREMENT INSTRUMENT INCLUDING ASYNCHRON...
- Publication number 20170176499
- Publication date Jun 22, 2017
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Application
CALIBRATION FOR TEST AND MEASUREMENT INSTRUMENT INCLUDING ASYNCHRON...
- Publication number 20160216295
- Publication date Jul 28, 2016
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC PROBE GROUND CONNECTION CHECKING TECHNIQUES
- Publication number 20160077128
- Publication date Mar 17, 2016
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Application
MULTI-SCOPE CONTROL AND SYNCHRONIZATION SYSTEM
- Publication number 20160077131
- Publication date Mar 17, 2016
- Tektronix, Inc.
- Barton T. Hickman
- G01 - MEASURING TESTING
Information Patent Application
TIME-DOMAIN REFLECTOMETER DE-EMBED PROBE
- Publication number 20150084660
- Publication date Mar 26, 2015
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC PROBE GROUND CONNECTION CHECKING TECHNIQUES
- Publication number 20140103951
- Publication date Apr 17, 2014
- Daniel G. KNIERIM
- G01 - MEASURING TESTING
Information Patent Application
GENERATING A TRIGGER FROM A DIFFERENTIAL SIGNAL
- Publication number 20100182050
- Publication date Jul 22, 2010
- Tektronix, Inc.
- Gene L. Markozen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Mode selection amplifier circuit usable in a signal acquisition probe
- Publication number 20070273438
- Publication date Nov 29, 2007
- Barton T. Hickman
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Automatic compensation of gain versus temperature
- Publication number 20070105516
- Publication date May 10, 2007
- Barton T. Hickman
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Stable in-phase/quadrature (I/Q) generator method and apparatus
- Publication number 20010033624
- Publication date Oct 25, 2001
- Daniel G. Knierim
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Low-noise four-quadrant multiplier method and apparatus
- Publication number 20010033192
- Publication date Oct 25, 2001
- Daniel G. Knierim
- G06 - COMPUTING CALCULATING COUNTING

Barton T. Hickman

Person

Patents Grantslast 30 patents

Precision, high bandwidth, switching attenuator

Frequency converter accessory for a test and measurement instrument

Automatic probe ground connection checking techniques

Systems and methods for synchronizing multiple test and measurement...

Automatic probe ground connection checking techniques

Calibration for test and measurement instrument including asynchron...

Systems and methods for synchronizing multiple test and measurement...

Noise reduction in digitizing systems

Calibration for test and measurement instrument including asynchron...

Automatic probe ground connection checking techniques

Multi-scope control and synchronization system

Calibration for test and measurement instrument including asynchron...

Automatic probe ground connection checking techniques

Generating a trigger from a differential signal

Mode selection amplifier circuit usable in a signal acquisition probe

Stable in-phase/quadrature (I/Q) generator method and apparatus

Smart probe apparatus and method for automatic self-adjustment of a...

Measurement test instrument and associated voltage management syste...

Low-noise four-quadrant multiplier method and apparatus

Patents Applicationslast 30 patents

PRECISION, HIGH BANDWIDTH, SWITCHING ATTENUATOR

AUTOMATIC DETERMINATION OF SPECTRUM AND SPECTROGRAM ATTRIBUTES IN A...

MULTIPLE SAMPLE-RATE DATA CONVERTER

PRECISION, HIGH BANDWIDTH, SWITCHING ATTENUATOR

SYSTEMS AND METHODS FOR SYNCHRONIZING MULTIPLE TEST AND MEASUREMENT...

FREQUENCY CONVERTER ACCESSORY FOR A TEST AND MEASUREMENT INSTRUMENT

Automatic Probe Ground Connection Checking Techniques

SIGNAL PATH CALIBRATION OF A HARDWARE SETTING IN A TEST AND MEASURE...

SYSTEMS AND METHODS FOR SYNCHRONIZING MULTIPLE TEST AND MEASUREMENT...

CALIBRATION FOR TEST AND MEASUREMENT INSTRUMENT INCLUDING ASYNCHRON...

Automatic Probe Ground Connection Checking Techniques

NOISE REDUCTION IN DIGITIZING SYSTEMS

CALIBRATION FOR TEST AND MEASUREMENT INSTRUMENT INCLUDING ASYNCHRON...

CALIBRATION FOR TEST AND MEASUREMENT INSTRUMENT INCLUDING ASYNCHRON...

AUTOMATIC PROBE GROUND CONNECTION CHECKING TECHNIQUES

MULTI-SCOPE CONTROL AND SYNCHRONIZATION SYSTEM

TIME-DOMAIN REFLECTOMETER DE-EMBED PROBE

AUTOMATIC PROBE GROUND CONNECTION CHECKING TECHNIQUES

GENERATING A TRIGGER FROM A DIFFERENTIAL SIGNAL

Mode selection amplifier circuit usable in a signal acquisition probe

Automatic compensation of gain versus temperature

Stable in-phase/quadrature (I/Q) generator method and apparatus

Low-noise four-quadrant multiplier method and apparatus