Bartosz Wlodarczak

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Swarzedz, PL

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Patents Grantslast 30 patents

Information Patent Grant
Universal compactor architecture for testing circuits
- Patent number 11,815,555
- Issue date Nov 14, 2023
- SIEMENS INDUSTRY SOFTWARE INC.
- Yingdi Liu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
X-Masking for In-System Deterministic Test
- Publication number 20240337693
- Publication date Oct 10, 2024
- Siemens Industry Software Inc.
- Janusz Rajski
- G01 - MEASURING TESTING
Information Patent Application
UNIVERSAL COMPACTOR ARCHITECTURE FOR TESTING CIRCUITS
- Publication number 20220308110
- Publication date Sep 29, 2022
- Siemens Industry Software Inc.
- Yingdi Liu
- G01 - MEASURING TESTING