Basab CHATTERJEE

Person

Allen, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Crack deflector structure for improving semiconductor device robust...
- Patent number 10,109,597
- Issue date Oct 23, 2018
- Texas Instruments Incorporated
- Jeffrey Alan West
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Crack deflector structure for improving semiconductor device robust...
- Patent number 8,912,076
- Issue date Dec 16, 2014
- Texas Instruments Incorporated
- Jeffrey Alan West
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Replacement of scribeline padframe with saw-friendly design
- Patent number 8,309,957
- Issue date Nov 13, 2012
- Texas Instruments Incorporated
- Basab Chatterjee
- G01 - MEASURING TESTING
Information Patent Grant
By-die-exposure for patterning of holes in edge die
- Patent number 8,273,523
- Issue date Sep 25, 2012
- Texas Instruments Incorporated
- Shangting Detweiler
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Reduction of punch-thru defects in damascene processing
- Patent number 7,727,885
- Issue date Jun 1, 2010
- Texas Instruments Incorporated
- Phillip Daniel Matz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Adjustable lithography blocking device and method
- Patent number 7,598,507
- Issue date Oct 6, 2009
- Texas Instruments Incorporated
- Basab Chatterjee
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
X-ray confocal defect detection systems and methods
- Patent number 7,212,607
- Issue date May 1, 2007
- Texas Instruments Incorporated
- Satyavolu Srinivas Papa Rao
- G01 - MEASURING TESTING
Information Patent Grant
X-ray defect detection in integrated circuit metallization
- Patent number 6,834,117
- Issue date Dec 21, 2004
- Texas Instruments Incorporated
- Satyavolu Papa Rao
- G01 - MEASURING TESTING
Information Patent Grant
Processes for chemical-mechanical polishing of a semiconductor wafer
- Patent number 6,579,798
- Issue date Jun 17, 2003
- Texas Instruments Incorporated
- Basab Chatterjee
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CRACK DEFLECTOR STRUCTURE FOR IMPROVING SEMICONDUCTOR DEVICE ROBUST...
- Publication number 20150061081
- Publication date Mar 5, 2015
- TEXAS INSTRUMENTS INCORPORATED
- Jeffrey Alan WEST
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Replacement of Scribeline Padframe with Saw-Friendly Design
- Publication number 20100264413
- Publication date Oct 21, 2010
- TEXAS INSTRUMENTS INCORPORATED
- Basab CHATTERJEE
- G01 - MEASURING TESTING
Information Patent Application
Crack Deflector Structure for Improving Semiconductor Device Robust...
- Publication number 20100109128
- Publication date May 6, 2010
- TEXAS INSTRUMENTS INCORPORATED
- Jeffrey Alan WEST
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BY-DIE-EXPOSURE FOR PATTERNING OF HOLES IN EDGE DIE
- Publication number 20080160779
- Publication date Jul 3, 2008
- Shangting Detweiler
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Reduction of punch-thru defects in damascene processing
- Publication number 20080057711
- Publication date Mar 6, 2008
- Texas Instrumentd incorporated
- Phillip Daniel Matz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System for in situ seed layer remediation
- Publication number 20050040046
- Publication date Feb 24, 2005
- Aaron Frank
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Application
Adjustable lithography blocking device and method
- Publication number 20040251429
- Publication date Dec 16, 2004
- Texas Instruments, Incorporated
- Basab Chatterjee
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
PROCESSES FOR CHEMICAL-MECHANICAL POLISHING OF A SEMICONDUCTOR WAFER
- Publication number 20030060049
- Publication date Mar 27, 2003
- Basab Chatterjee
- H01 - BASIC ELECTRIC ELEMENTS

Basab CHATTERJEE

Person

Patents Grantslast 30 patents

Crack deflector structure for improving semiconductor device robust...

Crack deflector structure for improving semiconductor device robust...

Replacement of scribeline padframe with saw-friendly design

By-die-exposure for patterning of holes in edge die

Reduction of punch-thru defects in damascene processing

Adjustable lithography blocking device and method

X-ray confocal defect detection systems and methods

X-ray defect detection in integrated circuit metallization

Processes for chemical-mechanical polishing of a semiconductor wafer

Patents Applicationslast 30 patents

CRACK DEFLECTOR STRUCTURE FOR IMPROVING SEMICONDUCTOR DEVICE ROBUST...

Replacement of Scribeline Padframe with Saw-Friendly Design

Crack Deflector Structure for Improving Semiconductor Device Robust...

BY-DIE-EXPOSURE FOR PATTERNING OF HOLES IN EDGE DIE

Reduction of punch-thru defects in damascene processing

System for in situ seed layer remediation

Adjustable lithography blocking device and method

PROCESSES FOR CHEMICAL-MECHANICAL POLISHING OF A SEMICONDUCTOR WAFER