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Beatus OFENLOCH-HAEHNLE

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Patents Grantslast 30 patents

  • Information Patent Grant

    Automatic analyzer and analysis method
    • Patent number 11,959,914
    • Issue date Apr 16, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Tatsuki Takakura
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 11,215,627
    • Issue date Jan 4, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Kenta Imai
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    AUTOMATIC ANALYZER AND ANALYSIS METHOD
    • Publication number 20200240981
    • Publication date Jul 30, 2020
    • HITACHI HIGH-TECH CORPORATION
    • Tatsuki TAKAKURA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20180246133
    • Publication date Aug 30, 2018
    • Hitachi High-Technologies Corporation
    • Kenta IMAI
    • G01 - MEASURING TESTING