Ben Ohler

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Santa Barbara, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Optical detection alignment/tracking method and apparatus
- Patent number 7,478,552
- Issue date Jan 20, 2009
- Veeco Instruments Inc.
- Doug Gotthard
- G01 - MEASURING TESTING
Information Patent Grant
Method of making a force curve measurement on a sample
- Patent number 7,387,035
- Issue date Jun 17, 2008
- Veeco Instruments Inc.
- Jens Struckmeier
- G01 - MEASURING TESTING
Information Patent Grant
Force scanning probe microscope
- Patent number 7,044,007
- Issue date May 16, 2006
- Veeco Instruments Inc.
- Jens Struckmeier
- G01 - MEASURING TESTING
Information Patent Grant
Manual control with force-feedback for probe microscopy-based force...
- Patent number 7,013,717
- Issue date Mar 21, 2006
- Veeco Instruments Inc.
- Jens Struckmeier
- G01 - MEASURING TESTING
Information Patent Grant
Force scanning probe microscope
- Patent number 6,677,697
- Issue date Jan 13, 2004
- Veeco Instruments Inc.
- Jens Struckmeier
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Optical detection alignment/tracking method and apparatus
- Publication number 20070220958
- Publication date Sep 27, 2007
- Veeco Instruments Inc.
- Doug Gotthard
- G01 - MEASURING TESTING
Information Patent Application
FORCE SCANNING PROBE MICROSCOPE
- Publication number 20060283240
- Publication date Dec 21, 2006
- Jens Struckmeier
- G01 - MEASURING TESTING
Information Patent Application
Force scanning probe microscope
- Publication number 20050081610
- Publication date Apr 21, 2005
- Jens Struckmeier
- G01 - MEASURING TESTING
Information Patent Application
Force scanning probe microscope
- Publication number 20030110844
- Publication date Jun 19, 2003
- Veeco Instruments Inc.
- Jens Struckmeier
- G01 - MEASURING TESTING