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Ben Tuval
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Brookline, MA, US
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last 30 patents
Information
Patent Grant
Detection system and detector array interconnect assemblies
Patent number
10,488,531
Issue date
Nov 26, 2019
Analogic Corporation
Ruvin Deych
G01 - MEASURING TESTING
Information
Patent Grant
Detection system and detector array interconnect assemblies
Patent number
10,429,520
Issue date
Oct 1, 2019
Analogic Corporation
Ruvin Deych
G01 - MEASURING TESTING
Information
Patent Grant
Anti-scatter grid or collimator
Patent number
9,601,223
Issue date
Mar 21, 2017
Analogic Corporation
Ruvin Deych
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Integrated radiation detecting and collimating assembly for X-ray t...
Patent number
5,991,357
Issue date
Nov 23, 1999
Analogic Corporation
Sorin Marcovici
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Coplanar X-ray photodiode assemblies
Patent number
5,587,611
Issue date
Dec 24, 1996
Analogic Corporation
Alexander T. Botka
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
DETECTION SYSTEM AND DETECTOR ARRAY INTERCONNECT ASSEMBLIES
Publication number
20160187498
Publication date
Jun 30, 2016
ANALOGIC CORPORATON
Ruvin DEYCH
G01 - MEASURING TESTING
Information
Patent Application
ANTI-SCATTER GRID OR COLLIMATOR
Publication number
20130121475
Publication date
May 16, 2013
Ruvin Deych
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING