BENEDIKT GEUKES

Person

BOEBLINGEN, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Logical clock connection in an integrated circuit design
- Patent number 12,204,832
- Issue date Jan 21, 2025
- International Business Machines Corporation
- Ali S. El-Zein
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automating addition of power supply rails, fences, and level transl...
- Patent number 11,907,634
- Issue date Feb 20, 2024
- International Business Machines Corporation
- Gavin B. Meil
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Clock mapping in an integrated circuit design
- Patent number 11,663,381
- Issue date May 30, 2023
- International Business Machines Corporation
- Stephen Gerard Shuma
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automatic detection of clock grid misalignments and automatic reali...
- Patent number 10,838,449
- Issue date Nov 17, 2020
- International Business Machines Corporation
- Benedikt Geukes
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Simultaneous scan chain initialization with disparate latches
- Patent number 10,658,062
- Issue date May 19, 2020
- International Business Machines Corporation
- Mitesh Agrawal
- G11 - INFORMATION STORAGE
Information Patent Grant
Simultaneous scan chain initialization with disparate latches
- Patent number 10,586,606
- Issue date Mar 10, 2020
- International Business Machines Corporation
- Mitesh Agrawal
- G11 - INFORMATION STORAGE
Information Patent Grant
Simultaneous scan chain initialization with disparate latches
- Patent number 10,199,121
- Issue date Feb 5, 2019
- International Business Machines Corporation
- Mitesh Agrawal
- G11 - INFORMATION STORAGE
Information Patent Grant
On-chip sequence profiler
- Patent number 10,156,610
- Issue date Dec 18, 2018
- International Business Machines Corporation
- Benedikt Geukes
- G01 - MEASURING TESTING
Information Patent Grant
Simultaneous scan chain initialization with disparate latches
- Patent number 10,096,377
- Issue date Oct 9, 2018
- International Business Machines Corporation
- Mitesh Agrawal
- G11 - INFORMATION STORAGE
Information Patent Grant
Simultaneous scan chain initialization with disparate latches
- Patent number 10,026,498
- Issue date Jul 17, 2018
- International Business Machines Corporation
- Mitesh Agrawal
- G11 - INFORMATION STORAGE
Information Patent Grant
Protecting chip settings using secured scan chains
- Patent number 9,727,754
- Issue date Aug 8, 2017
- International Business Machines Corporation
- Benedikt Geukes
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Protecting chip settings using secured scan chains
- Patent number 9,222,973
- Issue date Dec 29, 2015
- International Business Machines Corporation
- Benedikt Geukes
- G01 - MEASURING TESTING
Information Patent Grant
Method for secure self-booting of an electronic device
- Patent number 9,202,060
- Issue date Dec 1, 2015
- International Business Machines Corporation
- Benedikt Geukes
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for JTAG-driven remote scanning
- Patent number 9,110,137
- Issue date Aug 18, 2015
- International Business Machines Corporation
- Martin Doerr
- G01 - MEASURING TESTING
Information Patent Grant
Efficiency of compression of data pages
- Patent number 8,984,355
- Issue date Mar 17, 2015
- International Business Machines Corporation
- Benedikt Geukes
- G01 - MEASURING TESTING
Information Patent Grant
Controlling scan access to a scan chain
- Patent number 8,972,808
- Issue date Mar 3, 2015
- International Business Machines Corporation
- Benedikt Geukes
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for JTAG-driven remote scanning
- Patent number 8,914,693
- Issue date Dec 16, 2014
- International Business Machines Corporation
- Martin Doerr
- G01 - MEASURING TESTING
Information Patent Grant
Verifying and detecting boundary scan cells to input/output mapping
- Patent number 8,656,235
- Issue date Feb 18, 2014
- International Business Machines Corporation
- Benedikt Geukes
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
AUTOMATING ADDITION OF POWER SUPPLY RAILS, FENCES, AND LEVEL TRANSL...
- Publication number 20230072459
- Publication date Mar 9, 2023
- International Business Machines Corporation
- Gavin B. Meil
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CLOCK MAPPING IN AN INTEGRATED CIRCUIT DESIGN
- Publication number 20230075770
- Publication date Mar 9, 2023
- International Business Machines Corporation
- Stephen Gerard Shuma
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LOGICAL CLOCK CONNECTION IN AN INTEGRATED CIRCUIT DESIGN
- Publication number 20230070516
- Publication date Mar 9, 2023
- International Business Machines Corporation
- Ali S. El-Zein
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ITERATIVE DESIGN OF AN INTEGRATED CIRCUIT DESIGN
- Publication number 20230074528
- Publication date Mar 9, 2023
- International Business Machines Corporation
- Ali S. El-Zein
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATIC DETECTION OF CLOCK GRID MISALIGNMENTS AND AUTOMATIC REALI...
- Publication number 20200012312
- Publication date Jan 9, 2020
- International Business Machines Corporation
- Benedikt Geukes
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SIMULTANEOUS SCAN CHAIN INITIALIZATION WITH DISPARATE LATCHES
- Publication number 20200005883
- Publication date Jan 2, 2020
- International Business Machines Corporation
- Mitesh Agrawal
- G11 - INFORMATION STORAGE
Information Patent Application
SIMULTANEOUS SCAN CHAIN INITIALIZATION WITH DISPARATE LATCHES
- Publication number 20190156907
- Publication date May 23, 2019
- International Business Machines Corporation
- Mitesh Agrawal
- G11 - INFORMATION STORAGE
Information Patent Application
ON-CHIP SEQUENCE PROFILER
- Publication number 20180321314
- Publication date Nov 8, 2018
- International Business Machines Corporation
- Benedikt Geukes
- G01 - MEASURING TESTING
Information Patent Application
ON-CHIP SEQUENCE PROFILER
- Publication number 20180321315
- Publication date Nov 8, 2018
- International Business Machines Corporation
- Benedikt Geukes
- G01 - MEASURING TESTING
Information Patent Application
SIMULTANEOUS SCAN CHAIN INITIALIZATION WITH DISPARATE LATCHES
- Publication number 20180294041
- Publication date Oct 11, 2018
- International Business Machines Corporation
- Mitesh Agrawal
- G11 - INFORMATION STORAGE
Information Patent Application
SIMULTANEOUS SCAN CHAIN INITIALIZATION WITH DISPARATE LATCHES
- Publication number 20180294042
- Publication date Oct 11, 2018
- International Business Machines Corporation
- Mitesh Agrawal
- G11 - INFORMATION STORAGE
Information Patent Application
PROTECTING CHIP SETTINGS USING SECURED SCAN CHAINS
- Publication number 20160070933
- Publication date Mar 10, 2016
- International Business Machines Corporation
- Benedikt Geukes
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR JTAG-DRIVEN REMOTE SCANNING
- Publication number 20140089749
- Publication date Mar 27, 2014
- International Business Machines Corporation
- Martin Doerr
- G01 - MEASURING TESTING
Information Patent Application
Controlling Scan Access to a Scan Chain
- Publication number 20130219236
- Publication date Aug 22, 2013
- International Business Machines Corporation
- BENEDIKT GEUKES
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR JTAG-DRIVEN REMOTE SCANNING
- Publication number 20130212445
- Publication date Aug 15, 2013
- International Business Machines Corporation
- Martin Doerr
- G01 - MEASURING TESTING
Information Patent Application
Method for Secure Self-Booting of an Electronic Device
- Publication number 20130173899
- Publication date Jul 4, 2013
- International Business Machines Corporation
- Benedikt Geukes
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
EFFICIENCY OF COMPRESSION OF DATA PAGES
- Publication number 20130151915
- Publication date Jun 13, 2013
- International Business Machines Corporation
- BENEDIKT GEUKES
- G01 - MEASURING TESTING
Information Patent Application
VERIFYING AND DETECTING BOUNDARY SCAN CELLS TO INPUT/OUTPUT MAPPING
- Publication number 20130139014
- Publication date May 30, 2013
- International Business Machines Corporation
- Benedikt Geukes
- G01 - MEASURING TESTING
Information Patent Application
Self-healing and reconfiguration in an integrated circuit
- Publication number 20130111071
- Publication date May 2, 2013
- International Business Machines Corporation
- Gerald Kreissig
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROTECTING CHIP SETTINGS USING SECURED SCAN CHAINS
- Publication number 20120191403
- Publication date Jul 26, 2012
- International Business Machines Corporation
- Benedikt Geukes
- G06 - COMPUTING CALCULATING COUNTING

BENEDIKT GEUKES

Person

Patents Grantslast 30 patents

Logical clock connection in an integrated circuit design

Automating addition of power supply rails, fences, and level transl...

Clock mapping in an integrated circuit design

Automatic detection of clock grid misalignments and automatic reali...

Simultaneous scan chain initialization with disparate latches

Simultaneous scan chain initialization with disparate latches

Simultaneous scan chain initialization with disparate latches

On-chip sequence profiler

Simultaneous scan chain initialization with disparate latches

Simultaneous scan chain initialization with disparate latches

Protecting chip settings using secured scan chains

Protecting chip settings using secured scan chains

Method for secure self-booting of an electronic device

Method for JTAG-driven remote scanning

Efficiency of compression of data pages

Controlling scan access to a scan chain

Apparatus for JTAG-driven remote scanning

Verifying and detecting boundary scan cells to input/output mapping

Patents Applicationslast 30 patents

AUTOMATING ADDITION OF POWER SUPPLY RAILS, FENCES, AND LEVEL TRANSL...

CLOCK MAPPING IN AN INTEGRATED CIRCUIT DESIGN

LOGICAL CLOCK CONNECTION IN AN INTEGRATED CIRCUIT DESIGN

ITERATIVE DESIGN OF AN INTEGRATED CIRCUIT DESIGN

AUTOMATIC DETECTION OF CLOCK GRID MISALIGNMENTS AND AUTOMATIC REALI...

SIMULTANEOUS SCAN CHAIN INITIALIZATION WITH DISPARATE LATCHES

SIMULTANEOUS SCAN CHAIN INITIALIZATION WITH DISPARATE LATCHES

ON-CHIP SEQUENCE PROFILER

ON-CHIP SEQUENCE PROFILER

SIMULTANEOUS SCAN CHAIN INITIALIZATION WITH DISPARATE LATCHES

SIMULTANEOUS SCAN CHAIN INITIALIZATION WITH DISPARATE LATCHES

PROTECTING CHIP SETTINGS USING SECURED SCAN CHAINS

APPARATUS FOR JTAG-DRIVEN REMOTE SCANNING

Controlling Scan Access to a Scan Chain

APPARATUS FOR JTAG-DRIVEN REMOTE SCANNING

Method for Secure Self-Booting of an Electronic Device

EFFICIENCY OF COMPRESSION OF DATA PAGES

VERIFYING AND DETECTING BOUNDARY SCAN CELLS TO INPUT/OUTPUT MAPPING

Self-healing and reconfiguration in an integrated circuit

PROTECTING CHIP SETTINGS USING SECURED SCAN CHAINS