Benferhat Ramdane

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Oncy-Ecole, FR

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Patents Grantslast 30 patents

Information Patent Grant
System and process for analyzing a sample
- Patent number 8,310,675
- Issue date Nov 13, 2012
- Horiba Jobin Yvon Sas
- Pascal Amary
- G01 - MEASURING TESTING
Information Patent Grant
Achromatic spectroscopic ellipsometer with high spatial resolution
- Patent number 7,184,145
- Issue date Feb 27, 2007
- Horiba Jobin Yvon, Inc.
- Pascal Amary
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for optically characterising thin layered material
- Patent number 6,657,708
- Issue date Dec 2, 2003
- Jobin Yvon Sa
- Bernard Drevillon
- G01 - MEASURING TESTING
Information Patent Grant
Method of ellipsometric measurement, an ellipsometer and device for...
- Patent number 5,666,200
- Issue date Sep 9, 1997
- Instruments S.A.
- Bernard Drevillon
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND PROCESS FOR ANALYZING A SAMPLE
- Publication number 20100110427
- Publication date May 6, 2010
- HORIBA JOBIN YVON SAS
- Pascal Amary
- G01 - MEASURING TESTING
Information Patent Application
Achromatic spectroscopie ellipsometer with high spatial resolution
- Publication number 20060164642
- Publication date Jul 27, 2006
- Pascal Amary
- G01 - MEASURING TESTING