Benjamin B. Williams

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Thetford Ctr., VT, US

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Patents Grantslast 30 patents

Information Patent Grant
System and method for post-exposure dosimetry using electron parama...
- Patent number 10,371,780
- Issue date Aug 6, 2019
- The Trustees of Dartmouth College
- Sergey V. Petryakov
- G01 - MEASURING TESTING
Information Patent Grant
System and method for post-exposure dosimetry using electron parama...
- Patent number 9,255,901
- Issue date Feb 9, 2016
- The Trustees of Dartmouth College
- Harold M. Swartz
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR POST-EXPOSURE DOSIMETRY USING ELECTRON PARAMA...
- Publication number 20160370446
- Publication date Dec 22, 2016
- The Trustees of Dartmouth College
- Sergey V. Petryakov
- G01 - MEASURING TESTING
Information Patent Application
System And Method For Post-Exposure Dosimetry Using Electron Parama...
- Publication number 20120040304
- Publication date Feb 16, 2012
- Harold M. Swartz
- G01 - MEASURING TESTING