Benjamin Brown

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Palo Alto, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Methods and devices for fault tolerant quantum gates
- Patent number 11,940,834
- Issue date Mar 26, 2024
- PSIQUANTUM, CORP.
- Naomi Nickerson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and devices for fault tolerant quantum gates
- Patent number 11,460,876
- Issue date Oct 4, 2022
- PSIQUANTUM, CORP.
- Naomi Nickerson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Testing system and method
- Patent number 10,444,278
- Issue date Oct 15, 2019
- Xcerra Corporation
- Benjamin Brown
- G01 - MEASURING TESTING
Information Patent Grant
Testing system and method
- Patent number 10,379,154
- Issue date Aug 13, 2019
- Xcerra Corporation
- Benjamin Brown
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
COMPACT TESTING SYSTEM
- Publication number 20180095110
- Publication date Apr 5, 2018
- XCERRA CORPORATION
- BENJAMIN BROWN
- G01 - MEASURING TESTING
Information Patent Application
TESTING SYSTEM AND METHOD
- Publication number 20180080978
- Publication date Mar 22, 2018
- XCERRA CORPORATION
- Benjamin Brown
- G01 - MEASURING TESTING
Information Patent Application
TESTING SYSTEM AND METHOD
- Publication number 20180080979
- Publication date Mar 22, 2018
- XCERRA CORPORATION
- Benjamin Brown
- G01 - MEASURING TESTING